AM

Ashutosh Malshe

Micron: 162 patents #62 of 6,345Top 1%
ST Sandisk Technologies: 2 patents #967 of 2,224Top 45%
📍 Fremont, CA: #27 of 9,298 inventorsTop 1%
🗺 California: #830 of 386,348 inventorsTop 1%
Overall (All Time): #5,121 of 4,157,543Top 1%
164
Patents All Time

Issued Patents All Time

Showing 26–50 of 164 patents

Patent #TitleCo-InventorsDate
11829290 Garbage collection candidate selection using block overwrite rate Kishore Kumar Muchherla, Sampath K. Ratnam, Peter Feeley 2023-11-28
11810627 Selective read disturb sampling Kishore Kumar Muchherla, Harish Reddy Singidi, Renato C. Padilla, Vamsi Pavan Rayaprolu, Sampath K. Ratnam 2023-11-07
11797216 Read calibration based on ranges of program/erase cycles Vamsi Pavan Rayaprolu, Giuseppina Puzzilli, Karl D. Schuh, Jeffrey S. McNeil, Kishore Kumar Muchherla +1 more 2023-10-24
11797441 Cache media management Sampath K. Ratnam, Kishore Kumar Muchherla, Peter Feeley 2023-10-24
11791000 Valid translation unit count-based memory management Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla 2023-10-17
11782627 Read count scaling factor for data integrity scan Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu, Harish Reddy Singidi, Gianni Stephen Alsasua 2023-10-10
11782847 Performing a media management operation based on a sequence identifier for a block Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam 2023-10-10
11776655 Memory device virtual blocks using half good blocks Sri Rama Namala, Jung Sheng Hoei, Jianmin Huang, Xiangang Luo 2023-10-03
11762767 Storing highly read data at low impact read disturb pages of a memory device Kishore Kumar Muchherla, Giuseppina Puzzilli, Vamsi Pavan Rayaprolu, James Fitzpatrick, Shyam Sunder Raghunathan +2 more 2023-09-19
11755472 Periodic flush in memory component that is using greedy garbage collection Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Christopher S. Hale 2023-09-12
11740805 Selective relocation of data of a subset of a data block based on distribution of reliability statistics Kishore Kumar Muchherla, Vamsi Vamsi Rayaprolu, Harish Reddy Singidi 2023-08-29
11740957 Prioritization of error control operations at a memory sub-system Vamsi Pavan Rayaprolu, Harish Reddy Singidi, Kishore Kumar Muchherla, Xiangang Luo 2023-08-29
11733892 Partial superblock memory management Xiangang Luo, Huachen Li, Giuseppe D'Eliseo, Jianmin Huang 2023-08-22
11726867 Multi-page parity protection with power loss handling Harish Reddy Singidi, Kishore Kumar Muchherla, Xiangang Luo, Vamsi Pavan Rayaprolu 2023-08-15
11721404 Operation of mixed mode blocks Kishore Kumar Muchherla, Preston A. Thomson, Michael G. Miller, Gary F. Besinga, Scott Anthony Stoller +3 more 2023-08-08
11720493 Cache management based on memory device over-provisioning Kevin R. Brandt, Peter Feeley, Kishore Kumar Muchherla, Yun Li, Sampath K. Ratnam +2 more 2023-08-08
11715531 Open block management using storage charge loss margin checking Christopher M. Smitchger, Gary F. Besinga, Renato C. Padilla, Tawalin Opastrakoon, Sampath K. Ratnam +2 more 2023-08-01
11709633 Adjusting scan event thresholds to mitigate memory errors Gianni Stephen Alsasua, Harish Reddy Singidi, Peter Feeley, Renato C. Padilla, Kishore Kumar Muchherla +1 more 2023-07-25
11704179 Regression-based calibration and scanning of data units Vamsi Pavan Rayaprolu, Harish Reddy Singidi, Sampath K. Ratnam, Qisong Lin, Kishore Kumar Muchherla 2023-07-18
11698832 Selective sampling of a data unit during a program erase cycle based on error rate change patterns Harish Reddy Singidi, Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla 2023-07-11
11693767 Performing a media management operation based on changing a write mode of a data block in a cache Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam 2023-07-04
11688479 Read window based on program/erase cycles Vamsi Pavan Rayaprolu, Giuseppina Puzzilli, Karl D. Schuh, Jeffrey S. McNeil, Kishore Kumar Muchherla +1 more 2023-06-27
11688473 SLC page read Harish Reddy Singidi, Scott Anthony Stoller, Jung Sheng Hoei, Gianni Stephen Alsasua, Kishore Kumar Muchherla 2023-06-27
11687452 Dynamic program-verify voltage adjustment for intra-block storage charge loss uniformity Gary F. Besinga, Renato C. Padilla, Tawalin Opastrakoon, Sampath K. Ratnam, Michael G. Miller +2 more 2023-06-27
11682446 Selective wordline scans based on a data state metric Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Harish Reddy Singidi, Gianni Stephen Alsasua 2023-06-20