Issued Patents All Time
Showing 101–113 of 113 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8896832 | Discrete polarization scatterometry | Andrew V. Hill, Daniel Kandel, Vladimir Levinski, Joel Seligson, Alexander Svizher +3 more | 2014-11-25 |
| 8873054 | Metrology systems and methods | Daniel Kandel, Vladimir Levinski, Alexander Svizher, Joel Seligson, Andrew V. Hill +6 more | 2014-10-28 |
| 8681413 | Illumination control | Joel Seligson, Noam Sapiens | 2014-03-25 |
| 8582114 | Overlay metrology by pupil phase analysis | Daniel Kandel, Moshe Baruch, Vladimir Levinski, Noam Sapiens, Joel Seligson +4 more | 2013-11-12 |
| 8508748 | Inspection system with fiber coupled OCT focusing | — | 2013-08-13 |
| 8441639 | Metrology systems and methods | Daniel Kandel, Vladimir Levinski, Alexander Svizher, Joel Seligson, Andrew V. Hill +6 more | 2013-05-14 |
| 8214771 | Scatterometry metrology target design optimization | Michael Adel, Daniel Kandel | 2012-07-03 |
| 8209767 | Near field detection for optical metrology | — | 2012-06-26 |
| 8063463 | Solid state image wavelength converter | Giora Yahav | 2011-11-22 |
| 7884936 | Apparatus and methods for scattering-based semiconductor inspection and metrology | — | 2011-02-08 |
| 7196390 | Solid state image wavelength converter | Giora Yahav | 2007-03-27 |
| 6999219 | Optical modulator | Ori Braun, Giora Yahav | 2006-02-14 |
| 6331911 | Large aperture optical image shutter | Giora Yahav, Gavriel J. Iddan | 2001-12-18 |