YU

Yoshihiro Uozumi

KT Kabushiki Kaisha Toshiba: 25 patents #1,086 of 21,451Top 6%
Kioxia: 3 patents #479 of 1,813Top 30%
KK Kanto Kagaku: 1 patents #73 of 181Top 45%
Toshiba Memory: 1 patents #1,210 of 1,971Top 65%
SO Sony: 1 patents #17,262 of 25,231Top 70%
📍 Somers, NY: #31 of 237 inventorsTop 15%
🗺 New York: #4,200 of 115,490 inventorsTop 4%
Overall (All Time): #129,145 of 4,157,543Top 4%
29
Patents All Time

Issued Patents All Time

Showing 1–25 of 29 patents

Patent #TitleCo-InventorsDate
12068267 Semiconductor device and method for manufacturing the same 2024-08-20
11921428 Substrate processing method and substrate processing apparatus Shinsuke Kimura, Yoshihiro Ogawa, Hiroyasu Iimori, Tatsuhiko Koide, Hideaki Hirabayashi +1 more 2024-03-05
11621239 Semiconductor device and method for manufacturing the same 2023-04-04
9929017 Etching method using hydrogen peroxide solution containing tungsten Nagisa Takami 2018-03-27
9553189 Self-aligned silicide formation on source/drain through contact via 2017-01-24
9213242 Substrate processing method and substrate processing apparatus Shinsuke Kimura, Yoshihiro Ogawa, Hiroyasu Iimori, Tatsuhiko Koide, Hideaki Hirabayashi +1 more 2015-12-15
9099474 Self-aligned silicide formation on source/drain through contact via 2015-08-04
8946809 Method for manufacturing semiconductor memory device and semiconductor memory device Kazuhide Takamura, Ryota Katsumata, Masaru Kidoh, Daigo Ichinose, Toru Matsuda 2015-02-03
8912089 Method for manufacturing a semiconductor device including a stacked body comprising pluralities of first and second metallic conductive layers Seiichi Omoto, Tadashi Iguchi, Osamu Yamane, Kazuyuki Masukawa, Yoshihiro Yanai 2014-12-16
8513140 Post-dry etching cleaning liquid composition and process for fabricating semiconductor device Masafumi Muramatsu, Kazumi Asada, Yukino Hagino, Atsushi Okuyama, Takahito Nakajima +4 more 2013-08-20
8349718 Self-aligned silicide formation on source/drain through contact via 2013-01-08
8222160 Metal containing sacrifice material and method of damascene wiring formation 2012-07-17
8211800 Ru cap metal post cleaning method and cleaning chemical 2012-07-03
8168528 Restoration method using metal for better CD controllability and Cu filing Atsunobu Isobayashi 2012-05-01
7884027 Method of manufacturing semiconductor device Takashi Hirayama, Akira Kugita 2011-02-08
7850818 Method of manufacturing semiconductor device and cleaning apparatus Tsuyoshi Matsumura, Kunihiro Miyazaki 2010-12-14
7776754 Semiconductor device manufacturing method and chemical fluid used for manufacturing semiconductor device Kazuhiko Takase, Tsuyoshi Matsumura 2010-08-17
7635601 Method of manufacturing semiconductor device and cleaning apparatus Tsuyoshi Matsumura, Kunihiro Miyazaki 2009-12-22
7405133 Semiconductor device and method for manufacturing the same Katsuaki Natori, Tomohiro Saito 2008-07-29
7345352 Insulating tube, semiconductor device employing the tube, and method of manufacturing the same Tsuyoshi Matsumura, Takahito Nakajima, Hiroshi Kawamoto, Mikie Miyasato 2008-03-18
7282437 Insulating tube, semiconductor device employing the tube, and method of manufacturing the same Tsuyoshi Matsumura, Takahito Nakajima, Hiroshi Kawamoto, Mikie Miyasato 2007-10-16
7183203 Method of plating a metal or metal compound on a semiconductor substrate that includes using the same main component in both plating and etching solutions 2007-02-27
7022580 Semiconductor device and method for manufacturing the same Katsuaki Natori, Tomohiro Saito 2006-04-04
6995472 Insulating tube Tsuyoshi Matsumura, Takahito Nakajima, Hiroshi Kawamoto, Mikie Miyasato 2006-02-07
6818556 Method of plating a metal or metal compound on a semiconductor substrate that includes using the same main component in both plating and etching solutions 2004-11-16