PH

Ping He

JC J.A. Woollam Co.: 70 patents #4 of 52Top 8%
RP Razer (Asia-Pacific) Pte.: 8 patents #23 of 132Top 20%
EM Emc: 3 patents #978 of 3,345Top 30%
AR Agency For Science, Technology And Research: 2 patents #498 of 2,337Top 25%
WU Wright State University: 2 patents #15 of 103Top 15%
EC Emc Ip Holding Company: 1 patents #2,584 of 4,608Top 60%
SP Shenzhen Polytechnic: 1 patents #4 of 20Top 20%
SA Siemens Aktiengesellschaft: 1 patents #10,653 of 22,248Top 50%
AC Asia Vital Components Co.: 1 patents #133 of 246Top 55%
MR Mayo Medical Resources: 1 patents #1 of 7Top 15%
📍 Lincoln, NE: #3 of 1,303 inventorsTop 1%
🗺 Nebraska: #10 of 5,697 inventorsTop 1%
Overall (All Time): #12,770 of 4,157,543Top 1%
106
Patents All Time

Issued Patents All Time

Showing 76–100 of 106 patents

Patent #TitleCo-InventorsDate
7274450 Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems Steven E. Green, Galen L. Pfeiffer, Brian D. Guenther, Gerald T. Cooney, John A. Woollam +3 more 2007-09-25
7265838 Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like Blaine D. Johs, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, James D. Welch 2007-09-04
7245376 Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green +1 more 2007-07-17
7230699 Sample orientation system and method Martin M. Liphardt 2007-06-12
7215424 Broadband ellipsometer or polarimeter system including at least one multiple element lens Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green +1 more 2007-05-08
7193710 Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses Blaine D. Johs, Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green +1 more 2007-03-20
7158231 Spectroscopic ellipsometer and polarimeter systems John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Martin M. Liphardt, Galen L. Pfeiffer 2007-01-02
7136162 Alignment of ellipsometer beam to sample surface Martin M. Liphardt, Craig M. Herzinger, Brian D. Guenther, Steven E. Green, Galen L. Pfeiffer 2006-11-14
7075650 Discrete polarization state spectroscopic ellipsometer system and method of use Blaine D. Johs, Martin M. Liphardt, Jeffrey S. Hale 2006-07-11
7057717 System for and method of investigating the exact same point on a sample substrate with at least two wavelengths Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Christopher A. Goeden, John A. Woollam +1 more 2006-06-06
7046744 Method and apparatus for frequency offset estimation, and system utilizing same Chin Keong Ho, Sumei Sun 2006-05-16
6982792 Spectrophotometer, ellipsometer, polarimeter and the like systems John A. Woollam, Steven E. Green, Blaine D. Johs, Craig M. Herzinger, Galen L. Pfeiffer +2 more 2006-01-03
6950182 Functional equivalent to spatial filter in ellipsometer and the like systems Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger 2005-09-27
6930813 Spatial filter source beam conditioning in ellipsometer and the like systems Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, James D. Welch 2005-08-16
6883376 Method for determining the wall thickness and the speed of sound in a tube from reflected and transmitted ultrasound pulses 2005-04-26
6859278 Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems Blaine D. Johs, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, James D. Welch 2005-02-22
6804004 Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry Blaine D. Johs, Craig M. Herzinger, Martin M. Liphardt 2004-10-12
6634233 Method for determining the wall thickness and the speed of sound in a tube from reflected and transmitted ultrasound pulses 2003-10-21
6590655 System and method of improving electromagnetic radiation beam characteristics in ellipsometer and the like systems James D. Welch, Blaine D. Johs, Martin M. Liphardt 2003-07-08
6549282 Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipsometry and polarimetry systems Blaine D. Johs, Craig M. Herzinger, Martin M. Ciphardt 2003-04-15
6456376 Rotating compensator ellipsometer system with spatial filter Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger 2002-09-24
6430631 Electronic circuit for the conversion of data Guenther Rosenbaum 2002-08-06
6323424 Multiple electrical box mounting system having removable rings 2001-11-27
6293056 Multi-purpose above-ceiling utility support system 2001-09-25
6188022 Electrical box mounting system having removable rings 2001-02-13