Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12203749 | Chain elongation monitoring device and method for determining wear | Josef Siraky | 2025-01-21 |
| 11524848 | Apparatus and method for determining the wear condition of a chain | Peter Kreisfeld, Florian Madlener, Josef Siraky | 2022-12-13 |
| 11518622 | Apparatus and method for determining the wear condition of a chain | Peter Kreisfeld, Florian Madlener, Josef Siraky | 2022-12-06 |
| 11454304 | Actuator comprising anti-backbend chain | Florian Madlener, Joel Tchaweu Tchatchoua | 2022-09-27 |
| 11248684 | Actuator with an anti-backbend chain | Joel Tchaweu Tchatchoua, Orhan Sahin, Frank Rasch, Abhijit Potdar, Toralf Teuber +1 more | 2022-02-15 |
| 10801862 | Device and method for determining the wear state of a chain | Peter Kreisfeld, Florian Madlener, Josef Siraky | 2020-10-13 |
| 9229444 | Numerical control (NC) program and process for simplified reproduction on a machine tool | Monika Baierl-Moehler, Klaus Bauer, Sascha Brandt, Mirko Donatzer, Goetz Nothdurft +1 more | 2016-01-05 |
| 8393200 | Device and method for measuring mechanical properties of materials | Bernhard Scherzinger, Hans-Peter Vollmar | 2013-03-12 |
| 7425502 | Minimizing resist poisoning in the manufacture of semiconductor devices | Zhijian Lu, Scott Jessen | 2008-09-16 |
| 7262129 | Minimizing resist poisoning in the manufacture of semiconductor devices | Zhijian Lu, Scott Jessen | 2007-08-28 |
| 7160799 | Define via in dual damascene process | Steven Alan Lytle, Allen Yen | 2007-01-09 |
| 6985229 | Overlay metrology using scatterometry profiling | Cynthia C. Lee, Stephen Arlon Meisner, Alberto Santoni, John M. McIntosh | 2006-01-10 |
| 6559062 | Method for avoiding notching in a semiconductor interconnect during a metal etching step | Stephen W. Downey, Allen Yen, Paul B. Murphey | 2003-05-06 |
| 5780316 | Linewidth control apparatus and method | Hongzong Chew, John David Cuthbert, Hamlet Herring, John Louis Ryan, Robert Ching-I Sun +1 more | 1998-07-14 |
| 5215867 | Method with gas functionalized plasma developed layer | Larry E. Stillwagon, Gary N. Taylor, Thirumalai Venkatesan | 1993-06-01 |
| 5057462 | Compensation of lithographic and etch proximity effects | Juli H. Eisenberg, Larry Bruce Fritzinger, Chong-Cheng Fu, Taeho Kook | 1991-10-15 |
| 4757056 | Method for tumor regression in rats, mice and hamsters using hexuronyl hexosaminoglycan-containing compositions | Cornelius L. Van Gorp | 1988-07-12 |