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Method and system for automated generation of masks for spacer formation from a desired final wafer pattern |
Todd P. Lukanc, Christie R. K. Marrian |
2016-03-01 |
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Application of gate edge liner to maintain gate length CD in a replacement gate transistor flow |
Richard J. Carter, Sey-Shing Sun, Hong Lin, Verne Hornback |
2013-02-26 |
| 7956401 |
Bi-axial texturing of high-K dielectric films to reduce leakage currents |
Sey-Shing Sun, Wilbur G. Catabay |
2011-06-07 |
| 7896725 |
Balancing system and turning mechanism for remote controlled toy |
— |
2011-03-01 |
| 7619272 |
Bi-axial texturing of high-K dielectric films to reduce leakage currents |
Sey-Shing Sun, Wilbur G. Catabay |
2009-11-17 |
| 7553772 |
Process and apparatus for simultaneous light and radical surface treatment of integrated circuit structure |
Shiqun Gu, Hong Lin |
2009-06-30 |
| 7413996 |
High k gate insulator removal |
Arvind Kamath, Venkatesh P. Gopinath |
2008-08-19 |
| 7405116 |
Application of gate edge liner to maintain gate length CD in a replacement gate transistor flow |
Richard J. Carter, Sey-Shing Sun, Hong Lin, Verne Hornback |
2008-07-29 |
| 7365015 |
Damascene replacement metal gate process with controlled gate profile and length using Si1-xGex as sacrificial material |
Hong Lin, Sey-Shing Sun, Richard J. Carter |
2008-04-29 |
| 7341978 |
Superconductor wires for back end interconnects |
Shiqun Gu, Hong Lin |
2008-03-11 |
| 7312127 |
Incorporating dopants to enhance the dielectric properties of metal silicates |
Verne Hornback, Wilbur G. Catabay, Wei-Jen Hsia, Sey-Shing Sun |
2007-12-25 |
| 7259462 |
Interconnect dielectric tuning |
Hong Lin, Shiqun Gu, Wilbur G. Catabay, Zhihai Wang, Wei-Jen Hsia |
2007-08-21 |
| 7081406 |
Interconnect dielectric tuning |
Hong Lin, Shiqun Gu, Wilbur G. Catabay, Zhihai Wang, Wei-Jen Hsia |
2006-07-25 |
| 7064062 |
Incorporating dopants to enhance the dielectric properties of metal silicates |
Verne Hornback, Wilbur G. Catabay, Wei-Jen Hsia, Sey-Shing Sun |
2006-06-20 |
| 6864141 |
Method of incorporating nitrogen into metal silicate based dielectrics by energized nitrogen ion beams |
James Kimball, Verne Hornback |
2005-03-08 |
| 6849512 |
Thin gate dielectric for a CMOS transistor and method of fabrication thereof |
James Kimball, Verne Hornback |
2005-02-01 |
| 6830943 |
Thin film CMOS calibration standard having protective cover layer |
David Chan |
2004-12-14 |
| 6818516 |
Selective high k dielectrics removal |
Hong Lin, Shiqun Gu, James R. B. Elmer |
2004-11-16 |
| 6746925 |
High-k dielectric bird's beak optimizations using in-situ O2 plasma oxidation |
Hong Lin, Shiqun Gu, Jim Elmer |
2004-06-08 |
| 6674092 |
Thin film CMOS calibration standard having protective cover layer |
David Chan |
2004-01-06 |
