TR

Timothy A. Rost

TI Texas Instruments: 17 patents #768 of 12,488Top 7%
Overall (All Time): #276,860 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8982517 Electrostatic discharge protection apparatus Cynthia Ann Torres, Senthil Kumar Sundaramoorthy, Victor James Nuss 2015-03-17
8604524 Transistor design and layout for performance improvement with strain 2013-12-10
8604587 Capacitor integration at top-metal level with a protective cladding for copper surface protection Edmund Burke, Satyavolu S. Papa Rao 2013-12-10
7674682 Capacitor integration at top-metal level with a protective cladding for copper surface protection Edmund Burke, Satyavolu S. Papa Rao 2010-03-09
7482214 Transistor design and layout for performance improvement with strain 2009-01-27
7291897 One mask high density capacitor for integrated circuits Edmund Burke, Satyavolu S. Papa Rao 2007-11-06
7148558 Versatile system for limiting mobile charge ingress in SOI semiconductor structures Deems R. Hollingsworth 2006-12-12
7015093 Capacitor integration at top-metal level with a protection layer for the copper surface Satyavolu S. Papa Rao, Edmund Burke 2006-03-21
6924208 Dual mask capacitor for integrated circuits Edmund Burke, Satyavolu S. Papa Rao, Rose Alyssa Keagy 2005-08-02
6898068 Dual mask capacitor for integrated circuits Edmund Burke, Satyavolu S. Papa Rao, Rose Alyssa Keagy 2005-05-24
6815970 Method for measuring NBTI degradation effects on integrated circuits Vijay Reddy 2004-11-09
6803295 Versatile system for limiting mobile charge ingress in SOI semiconductor structures Deems R. Hollingsworth 2004-10-12
6710443 INTEGRATED CIRCUIT PROVIDING THERMALLY CONDUCTIVE STRUCTURES SUBSTANTIALLY HORIZONTALLY COUPLED TO ONE ANOTHER WITHIN ONE OR MORE HEAT DISSIPATION LAYERS TO DISSIPATE HEAT FROM A HEAT GENERATING STRUCTURE William R. Hunter, Bradley Young 2004-03-23
6326274 Method for improving performance and reliability of MOS technologies and data retention characteristics of flash memory cells Kenneth C. Harvey 2001-12-04
6221705 Method for improving performance and reliability of MOS technologies and data retention characteristics of flash memory cells Kenneth C. Harvey 2001-04-24
6143594 On-chip ESD protection in dual voltage CMOS Alwin Tsao, Vikas Gupta, Gregory Charles Baldwin, E. Ajith Amerasekera, David B. Spratt 2000-11-07
6137144 On-chip ESD protection in dual voltage CMOS Alwin Tsao, Vikas Gupta, Gregory Charles Baldwin, E. Ajith Amerasekera, David B. Spratt 2000-10-24