Issued Patents All Time
Showing 25 most recent of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12280094 | Methods and compositions for natural killer cells | Alicja Copik, Jeremiah Oyer | 2025-04-22 |
| 11617781 | Methods and compositions for natural killer cells | Alicja Copik, Jeremiah Oyer | 2023-04-04 |
| 10874715 | Methods and compositions for natural killer cells | Alicja Copik, Jeremiah Oyer | 2020-12-29 |
| 10463715 | Methods and compositions for natural killer cells | Alicja Copik, Jeremiah Oyer | 2019-11-05 |
| 9778313 | Devices under test | Min Chen | 2017-10-03 |
| 9714966 | Circuit aging sensor | Min Chen, John Michael Carulli, Jr. | 2017-07-25 |
| 9623082 | Methods and compositions for natural killer cells | Alicja Copik, Jeremiah Oyer | 2017-04-18 |
| 9110111 | Methods and systems to determine a final value of random telegraph noise time constant and magnitude | Gautam Kapila | 2015-08-18 |
| 9035706 | Variability and aging sensor for integrated circuits | Min Chen | 2015-05-19 |
| 8753941 | High performance asymmetric cascoded transistor | Kamel Benaissa, Samuel Suresh Martin, T Krishnaswamy | 2014-06-17 |
| 8239814 | Parameter drift prediction | — | 2012-08-07 |
| 8138829 | Segmented power amplifier with varying segment activation | Srikanth Krishnan, Brian Paul Ginsburg, Srinath Ramaswamy, Chih-Ming Hung | 2012-03-20 |
| 7974595 | Methodology for assessing degradation due to radio frequency excitation of transistors | Andrew Marshall, Siraj Akhtar, Srikanth Krishnan, Karan Singh Bhatia | 2011-07-05 |
| 7952378 | Tunable stress technique for reliability degradation measurement | Andrew Marshall | 2011-05-31 |
| 7737717 | Current-voltage-based method for evaluating thin dielectrics based on interface traps | Paul Edward Nicollian, Anand Krishnan | 2010-06-15 |
| 7385383 | Methods and systems for determining efficacy of stress protection circuitry | Gianluca Boselli, Jeremy C. Smith | 2008-06-10 |
| 7263455 | Apparatus and methods for ferroelectric ram fatigue testing | John Anthony Rodriguez | 2007-08-28 |
| 7218132 | System and method for accurate negative bias temperature instability characterization | Anand Krishnan, Srikanth Krishnan, Cathy Chancellor | 2007-05-15 |
| 7212023 | System and method for accurate negative bias temperature instability characterization | Anand Krishnan, Srikanth Krishnan, Cathy Chancellor | 2007-05-01 |
| 7196887 | PMOS electrostatic discharge (ESD) protection device | Gianluca Boselli, Ekanayake A. Amerasekera | 2007-03-27 |
| 7026838 | Versatile system for accelerated stress characterization of semiconductor device structures | Prasun K. Raha | 2006-04-11 |
| 6963111 | Efficient pMOS ESD protection circuit | Gianluca Boselli, Ekanayake A. Amerasekera | 2005-11-08 |
| 6933731 | Method and system for determining transistor degradation mechanisms | Robert L. Pitts | 2005-08-23 |
| 6928376 | Apparatus and methods for ferroelectric ram fatigue testing | John Anthony Rodriguez | 2005-08-09 |
| 6815970 | Method for measuring NBTI degradation effects on integrated circuits | Timothy A. Rost | 2004-11-09 |