Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8924904 | Method and apparatus for determining factors for design consideration in yield analysis | Vicky Svidenko, Youval Nehmadi, Alexander T. Schwarm, Sundar Jawaharlah | 2014-12-30 |
| 8799831 | Inline defect analysis for sampling and SPC | Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal | 2014-08-05 |
| 8688398 | Method and apparatus for robot calibrations with a calibrating device | Vijay K. Sakhare, Sekar Krishnasamy, Mordechai Leska, Donald Foldenauer, Marvin L. Freeman +2 more | 2014-04-01 |
| 8335582 | Software application to analyze event log and chart tool fail rate as function of chamber and recipe | — | 2012-12-18 |
| 8260461 | Method and system for robot calibrations with a camera | Sekar Krishnasamy, Vijay K. Sakhare, Mordechai Leska, Donald Foldenauer, Satish Sundar | 2012-09-04 |
| 8224607 | Method and apparatus for robot calibrations with a calibrating device | Vijay K. Sakhare, Sekar Krishnasamy, Mordechai Leska, Donald Foldenauer, Marvin L. Freeman +2 more | 2012-07-17 |
| 7962864 | Stage yield prediction | Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal | 2011-06-14 |
| 7937179 | Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects | Youval Nehmadi, Vicky Svidenko, Alexander T. Schwarm, Sundar Jawaharlal | 2011-05-03 |
| 7760929 | Grouping systematic defects with feedback from electrical inspection | Jacob J Orbon, Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid +1 more | 2010-07-20 |