Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12373936 | System and method for overlay metrology using a phase mask | Iftach Galon, Itay Gdor, Yuval Lubashevsky, Yaniv Weiss | 2025-07-29 |
| 12222199 | Systems and methods for measurement of misregistration and amelioration thereof | Roie Volkovich, Nachshon Rothman, Yossi Simon, Anna Golotsvan, Vladimir Levinski +3 more | 2025-02-11 |
| 12165930 | Adaptive modeling misregistration measurement system and method | Amnon Manassen, Vladimir Levinski, Daria Negri | 2024-12-10 |
| 12078601 | Universal metrology model | Vladimir Levinski, Amnon Manassen | 2024-09-03 |
| 12067745 | Image pre-processing for overlay metrology using decomposition techniques | Vladimir Levinski | 2024-08-20 |
| 12001148 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Yossi Simon, Daria Negri +9 more | 2024-06-04 |
| 11592755 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Yossi Simon, Daria Negri +9 more | 2023-02-28 |