Issued Patents All Time
Showing 1–25 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11344820 | Fluid treatment systems and methods | Benjamin Clegg, Ryan Mawson, Brian Busath | 2022-05-31 |
| 11338218 | Fluid treatment apparatus and methods | Benjamin Clegg, Ryan Mawson, Brian Busath | 2022-05-24 |
| 10974161 | Fluid treatment systems | Benjamin Clegg, Ryan Mawson, Brian Busath | 2021-04-13 |
| 10402895 | Computer-assisted shopping and product location | — | 2019-09-03 |
| 9741071 | Computer-assisted shopping and product location | — | 2017-08-22 |
| 9533238 | Controlled-gradient, accelerated vapor-recompression apparatus and method | J. Clair Batty, David A. Bell, Christopher Miles Miller | 2017-01-03 |
| 9205347 | Controlled-gradient, accelerated vapor-recompression apparatus and method | J. Clair Batty, David A. Bell, Christopher Miles Miller | 2015-12-08 |
| 9044693 | Controlled-gradient, accelerated-vapor-recompression apparatus and method | J. Clair Batty, David A. Bell, Christopher Miles Miller | 2015-06-02 |
| 9005404 | Controlled-gradient, accelerated-vapor-recompression apparatus and method | J. Clair Batty, David A. Bell, Christopher Miles Miller | 2015-04-14 |
| 8986509 | Controlled-gradient, accelerated-vapor-recompression apparatus and method | J. Clair Batty, David A. Bell, Christopher Miles Miller | 2015-03-24 |
| 8845865 | Controlled-gradient, accelerated-vapor-recompression apparatus and method | J. Clair Batty, David A. Bell, Christopher Miles Miller | 2014-09-30 |
| 8425668 | Wastewater pre-treatment and evaporation system | Janos I. Lakatos, Edward Clay Slade, Clayton R. Carter, Christopher Jahn | 2013-04-23 |
| 8392260 | Short-charge cordless scanner for retail terminals | — | 2013-03-05 |
| 8333323 | Mobile device using short cycle power source | James T. Sauerwein, Douglas M. Hinson, Ynjiun P. Wang | 2012-12-18 |
| 7569834 | High resolution charged particle projection lens array using magnetic elements | — | 2009-08-04 |
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, Gustavo A. Pinto, David L. Adler, Robert Long, Kurt H. Weiner +2 more | 2005-07-26 |
| 6636064 | Dual probe test structures for semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Kurt H. Weiner, David J. Walker | 2003-10-21 |
| 6633174 | Stepper type test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Gustavo A. Pinto, David J. Walker | 2003-10-14 |
| 6627884 | Simultaneous flooding and inspection for charge control in an electron beam inspection machine | Mark A. McCord, David J. Walker, Jun Pei | 2003-09-30 |
| 6576923 | Inspectable buried test structures and methods for inspecting the same | Akella V. S. Satya, Robert Long, Lynda C. Mantalas, Gustavo A. Pinto | 2003-06-10 |
| 6528818 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, Gustavo A. Pinto, David L. Adler, Robert Long, Kurt H. Weiner +2 more | 2003-03-04 |
| 6524873 | Continuous movement scans of test structures on semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Bin-Ming Benjamin Tsai, David J. Walker | 2003-02-25 |
| 6509197 | Inspectable buried test structures and methods for inspecting the same | Akella V. S. Satya, Robert Long, Lynda C. Mantalas, Gustavo A. Pinto | 2003-01-21 |
| 6445199 | Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures | Akella V. S. Satya, Brian C. Leslie, Gustavo A. Pinto, Robert Long, Bin-Ming Benjamin Tsai | 2002-09-03 |
| 6211518 | Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments | Farid Askary, Stefano E. Concina, Kevin M. Monahan, David L. Adler | 2001-04-03 |