Issued Patents All Time
Showing 25 most recent of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11788306 | Building debris containment method | — | 2023-10-17 |
| 11578497 | Barrier members for a building debris containment system | — | 2023-02-14 |
| 11326361 | Building debris containment system | — | 2022-05-10 |
| 10883286 | Building debris containment system | — | 2021-01-05 |
| 10626606 | Load transfer device | Darryl Dixon, Venkatesh Seshappa, Craig Van Brocklin | 2020-04-21 |
| 9957713 | Load transfer device | Darryl Dixon, Venkatesh Seshappa, Craig Van Brocklin | 2018-05-01 |
| 9885180 | Load transfer device | — | 2018-02-06 |
| 9074370 | Load transfer device | — | 2015-07-07 |
| 9033302 | Taper-ended form tie | — | 2015-05-19 |
| 8839580 | Load transfer device | — | 2014-09-23 |
| 8365501 | Wide-body connector for concrete sandwich walls | — | 2013-02-05 |
| 8191853 | Concrete form holding a partial sheet of insulation at a preselected position therein | — | 2012-06-05 |
| 7712272 | Symmetrical load transfer device for insulated concrete sandwich wall panels | — | 2010-05-11 |
| 7656170 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, David J. Walker | 2010-02-02 |
| 7374114 | Device for the destruction of disc media | Joel Pekay, Brian Gurin, Jim Liles | 2008-05-20 |
| 7266931 | Concrete sandwich wall panels and a connector system for use therein | — | 2007-09-11 |
| 7012439 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, David J. Walker | 2006-03-14 |
| 6945506 | Connector assembly for insulated concrete walls | — | 2005-09-20 |
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, Gustavo A. Pinto, David L. Adler, Neil Richardson, Kurt H. Weiner +2 more | 2005-07-26 |
| 6867606 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, David J. Walker | 2005-03-15 |
| 6813572 | Apparatus and methods for managing reliability of semiconductor devices | Akella V. S. Satya, Li Song, Kurt H. Weiner | 2004-11-02 |
| 6751519 | Methods and systems for predicting IC chip yield | Akella V. S. Satya, Li Song, Kurt H. Weiner | 2004-06-15 |
| 6711862 | Dry-cast hollowcore concrete sandwich panels | — | 2004-03-30 |
| 6576923 | Inspectable buried test structures and methods for inspecting the same | Akella V. S. Satya, Lynda C. Mantalas, Gustavo A. Pinto, Neil Richardson | 2003-06-10 |
| 6566885 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, David J. Walker | 2003-05-20 |