Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7655482 | Chemical mechanical polishing test structures and methods for inspecting the same | Lynda C. Mantalas, Gustavo A. Pinto | 2010-02-02 |
| 7656170 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Robert Long, David J. Walker | 2010-02-02 |
| 7179661 | Chemical mechanical polishing test structures and methods for inspecting the same | Lynda C. Mantalas, Gustavo A. Pinto | 2007-02-20 |
| 7012439 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Robert Long, David J. Walker | 2006-03-14 |
| 6948141 | Apparatus and methods for determining critical area of semiconductor design data | Vladimir Federov, Li Song | 2005-09-20 |
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits | Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson, Kurt H. Weiner +2 more | 2005-07-26 |
| 6918101 | Apparatus and methods for determining critical area of semiconductor design data | Raman K. Nurani, Li Song | 2005-07-12 |
| 6867606 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Robert Long, David J. Walker | 2005-03-15 |
| 6813572 | Apparatus and methods for managing reliability of semiconductor devices | Li Song, Robert Long, Kurt H. Weiner | 2004-11-02 |
| 6771806 | Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices | David L. Adler, Bin-Ming Benjamin Tsai, David J. Walker | 2004-08-03 |
| 6751519 | Methods and systems for predicting IC chip yield | Li Song, Robert Long, Kurt H. Weiner | 2004-06-15 |
| 6636064 | Dual probe test structures for semiconductor integrated circuits | David L. Adler, Neil Richardson, Kurt H. Weiner, David J. Walker | 2003-10-21 |
| 6633174 | Stepper type test structures and methods for inspection of semiconductor integrated circuits | David L. Adler, Neil Richardson, Gustavo A. Pinto, David J. Walker | 2003-10-14 |
| 6576923 | Inspectable buried test structures and methods for inspecting the same | Robert Long, Lynda C. Mantalas, Gustavo A. Pinto, Neil Richardson | 2003-06-10 |
| 6566885 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Robert Long, David J. Walker | 2003-05-20 |
| 6528818 | Test structures and methods for inspection of semiconductor integrated circuits | Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson, Kurt H. Weiner +2 more | 2003-03-04 |
| 6524873 | Continuous movement scans of test structures on semiconductor integrated circuits | David L. Adler, Bin-Ming Benjamin Tsai, Neil Richardson, David J. Walker | 2003-02-25 |
| 6509197 | Inspectable buried test structures and methods for inspecting the same | Robert Long, Lynda C. Mantalas, Gustavo A. Pinto, Neil Richardson | 2003-01-21 |
| 6445199 | Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures | Brian C. Leslie, Gustavo A. Pinto, Robert Long, Neil Richardson, Bin-Ming Benjamin Tsai | 2002-09-03 |
| 6433561 | Methods and apparatus for optimizing semiconductor inspection tools | Gustavo A. Pinto, Robert Long, Bin-Ming Benjamin Tsai, Brian C. Leslie | 2002-08-13 |