Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8772772 | System and method for increasing productivity of combinatorial screening | Kurt H. Weiner, Tony P. Chiang | 2014-07-08 |
| 7655482 | Chemical mechanical polishing test structures and methods for inspecting the same | Akella V. S. Satya, Lynda C. Mantalas | 2010-02-02 |
| 7656170 | Multiple directional scans of test structures on semiconductor integrated circuits | Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long, David J. Walker | 2010-02-02 |
| 7179661 | Chemical mechanical polishing test structures and methods for inspecting the same | Akella V. S. Satya, Lynda C. Mantalas | 2007-02-20 |
| 7012439 | Multiple directional scans of test structures on semiconductor integrated circuits | Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long, David J. Walker | 2006-03-14 |
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Robert Long, Neil Richardson, Kurt H. Weiner +2 more | 2005-07-26 |
| 6867606 | Multiple directional scans of test structures on semiconductor integrated circuits | Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long, David J. Walker | 2005-03-15 |
| 6633174 | Stepper type test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Neil Richardson, David J. Walker | 2003-10-14 |
| 6576923 | Inspectable buried test structures and methods for inspecting the same | Akella V. S. Satya, Robert Long, Lynda C. Mantalas, Neil Richardson | 2003-06-10 |
| 6566885 | Multiple directional scans of test structures on semiconductor integrated circuits | Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long, David J. Walker | 2003-05-20 |
| 6528818 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Robert Long, Neil Richardson, Kurt H. Weiner +2 more | 2003-03-04 |
| 6509197 | Inspectable buried test structures and methods for inspecting the same | Akella V. S. Satya, Robert Long, Lynda C. Mantalas, Neil Richardson | 2003-01-21 |
| 6445199 | Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures | Akella V. S. Satya, Brian C. Leslie, Robert Long, Neil Richardson, Bin-Ming Benjamin Tsai | 2002-09-03 |
| 6433561 | Methods and apparatus for optimizing semiconductor inspection tools | Akella V. S. Satya, Robert Long, Bin-Ming Benjamin Tsai, Brian C. Leslie | 2002-08-13 |