Issued Patents All Time
Showing 1–25 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8601816 | Closed-cycle MHD-faraday generation of electric power using steam as the gaseous medium | — | 2013-12-10 |
| 8047162 | Black plant steam furnace injection | Mikhail Maryamchik, Michael J. Szmania, Donald L. Wietzke | 2011-11-01 |
| 7656170 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long | 2010-02-02 |
| 7566873 | High-resolution, low-distortion and high-efficiency optical coupling in detection system of electron beam apparatus | Salam Harb, Vassil Spasov, David G. Stites, Izzy Lewis, Marian Mankos | 2009-07-28 |
| 7464669 | Integrated fluidized bed ash cooler | Mikhail Maryamchik, Michael J. Szmania, David E. James, Donald L. Wietzke | 2008-12-16 |
| 7282087 | Wetted particle and droplet impingement surface | Mikhail Maryamchik | 2007-10-16 |
| 7012439 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long | 2006-03-14 |
| 6984822 | Apparatus and method for secondary electron emission microscope | David L. Adler, Fred Babian, Travis Wolfe | 2006-01-10 |
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson +2 more | 2005-07-26 |
| 6868795 | Bubble cap assembly | Mikhail Maryamchik, Gary L. Anderson, Jeffrey Hahn, Edwin L. Collins, III, Jeffrey J. Bolebruch | 2005-03-22 |
| 6867606 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long | 2005-03-15 |
| 6863703 | Compact footprint CFB with mechanical dust collector | Mikhail Maryamchik, Felix Belin, Donald L. Wietzke | 2005-03-08 |
| 6771806 | Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices | Akella V. S. Satya, David L. Adler, Bin-Ming Benjamin Tsai | 2004-08-03 |
| 6713759 | Apparatus and method for secondary electron emission microscope | David L. Adler, Fred Babian, Travis Wolfe | 2004-03-30 |
| 6681722 | Floored impact-type solids separator using downward expanding separator elements | Mikhail Maryamchik, Michael J. Szmania, Donald L. Wietzke | 2004-01-27 |
| 6636064 | Dual probe test structures for semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Neil Richardson, Kurt H. Weiner | 2003-10-21 |
| 6633174 | Stepper type test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Neil Richardson, Gustavo A. Pinto | 2003-10-14 |
| 6627884 | Simultaneous flooding and inspection for charge control in an electron beam inspection machine | Mark A. McCord, Jun Pei, Neil Richardson | 2003-09-30 |
| 6566885 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long | 2003-05-20 |
| 6532905 | CFB with controllable in-bed heat exchanger | Felix Belin, Mikhail Maryamchik, Sundara M. Kavidass, Donald L. Wietzke | 2003-03-18 |
| 6528818 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson +2 more | 2003-03-04 |
| 6524873 | Continuous movement scans of test structures on semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Bin-Ming Benjamin Tsai, Neil Richardson | 2003-02-25 |
| 6500221 | Cooled tubes arranged to form impact type particle separators | Mikhail Maryamchik, Sundara M. Kavidass, Felix Belin, Kiplin C. Alexander, David E. James +2 more | 2002-12-31 |
| 6491000 | Wall protection from downward flowing solids | Donald L. Wietzke, Gary L. Anderson, Richard F. Romansky, Jr. | 2002-12-10 |
| 6454824 | CFB impact type particle collection elements attached to cooled supports | Mikhail Maryamchik, Kiplin C. Alexander, Felix Belin, David Robert Gibbs, Donald L. Wietzke | 2002-09-24 |