Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12292330 | Spectrometry apparatus | Masahiro Watanabe, Takenori Hirose | 2025-05-06 |
| 11733264 | Cantilever, scanning probe microscope, and measurement method using scanning probe microscope | Takenori Hirose, Tomonori Saeki | 2023-08-22 |
| 11445067 | Controlled incoming query distribution based on skip criteria | Yongxiang Dai, Xu Li | 2022-09-13 |
| 10890958 | Centralized power meter and centralized power calculation method | Gan Wen, Ge Huang | 2021-01-12 |
| 10877065 | Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method | Shinichi Taniguchi | 2020-12-29 |
| 10823686 | X-ray inspection method and X-ray inspection device | Yuta Urano, Yoshiki Matoba, Akihiro Takeda | 2020-11-03 |
| 10429411 | Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method | Shinichi Taniguchi | 2019-10-01 |
| 10352879 | X-ray inspection method and device | Toshiyuki Nakao, Yuta Urano, Hideaki Sasazawa | 2019-07-16 |
| 9371695 | Integrated sidetrack drilling tool | Lan Zhang, Xinyue Zhang | 2016-06-21 |
| 9304145 | Inspection method and its apparatus for thermal assist type magnetic head element | Takenori Hirose, Masahiro Watanabe, Toshinori Sugiyama, Akira TOBITA | 2016-04-05 |
| 8787134 | Thermally assisted magnetic recording head inspection method and apparatus | Takenori Hirose, Masahiro Watanabe, Shinji Homma, Tsuneo Nakagomi, Teruaki Tokutomi +2 more | 2014-07-22 |
| 8713710 | Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus | Takenori Hirose, Masahiro Watanabe, Tsuneo Nakagomi, Shinji Honma, Teruaki Tokutomi +2 more | 2014-04-29 |
| 8621659 | Cantilever for magnetic force microscope and method of manufacturing the same | Takenori Hirose, Masahiro Watanabe, Tetsuya Matsui, Tsuneo Nakagomi, Teruaki Tokutomi | 2013-12-31 |
| 8483035 | Thermally assisted magnetic recording head inspection method and apparatus | Takenori Hirose, Masahiro Watanabe, Shinji Homma, Tsuneo Nakagomi, Teruaki Tokutomi +2 more | 2013-07-09 |