Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6747472 | Temporary device attach structure for test and burn in of microjoint interconnects and method for fabricating the same | John Harold Magerlein, Samuel McKnight, Kevin S. Petrarca, Sampath Purushothaman, Carlos J. Sambucetti +2 more | 2004-06-08 |
| 6275051 | Segmented architecture for wafer test and burn-in | Thomas W. Bachelder, Dennis R. Barringer, Dennis R. Conti, James M. Crafts, David L. Gardell +5 more | 2001-08-14 |
| 6255208 | Selective wafer-level testing and burn-in | William E. Bernier, Claude L. Bertin, Anilkumar C. Bhatt, Michael A. Gaynes, Erik L. Hedberg +5 more | 2001-07-03 |
| 5519193 | Method and apparatus for stressing, burning in and reducing leakage current of electronic devices using microwave radiation | Peter E. Freiermuth, Kathleen S. Ginn, Jeffrey A. Haley, Susan J. LaMaire, David Lewis +7 more | 1996-05-21 |