Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7268574 | Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces | Ralph Schaeffer | 2007-09-11 |
| 7250780 | Probe card for semiconductor wafers having mounting plate and socket | David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty | 2007-07-31 |
| 6798224 | Method for testing semiconductor wafers | David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty | 2004-09-28 |
| 6623345 | Wafer for cleaning semiconductor device probe | Larry D. Angell | 2003-09-23 |
| 6419844 | Method for fabricating calibration target for calibrating semiconductor wafer test systems | Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark, John O. Jacobson | 2002-07-16 |
| 6420892 | Calibration target for calibrating semiconductor wafer test systems | Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark, John O. Jacobson | 2002-07-16 |
| 6359456 | Probe card and test system for semiconductor wafers | David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty | 2002-03-19 |
| 6275052 | Probe card and testing method for semiconductor wafers | David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty | 2001-08-14 |
| 6257958 | Method for cleaning semiconductor device probe | Larry D. Angell | 2001-07-10 |
| 6254469 | Wafer for cleaning semiconductor device probe | Larry D. Angell | 2001-07-03 |
| 6239590 | Calibration target for calibrating semiconductor wafer test systems | Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark, John O. Jacobson | 2001-05-29 |
| 6060891 | Probe card for semiconductor wafers and method and system for testing wafers | David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty | 2000-05-09 |
| 6023172 | Light-based method and apparatus for maintaining probe cards | — | 2000-02-08 |
| 6019663 | System for cleaning semiconductor device probe | Larry D. Angell | 2000-02-01 |