RT

Robert Turkot

IN Intel: 13 patents #3,143 of 30,777Top 15%
Overall (All Time): #375,495 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11515402 Microelectronic transistor source/drain formation using angled etching Seung Hoon Sung, Marko Radosavljevic, Han Wui Then, Willy Rachmady, Sansaptak Dasgupta +1 more 2022-11-29
8017568 Cleaning residues from semiconductor structures Shan Clark, Vijayakumar Ramachandrarao 2011-09-13
7387927 Reducing oxidation under a high K gate dielectric Justin K. Brask, Jack T. Kavalieros, Mark L. Doczy, Matthew V. Metz, Uday Shah +2 more 2008-06-17
7233068 Filling small dimension vias using supercritical carbon dioxide Vijayakumar Ramachandrarao 2007-06-19
7129182 Method for etching a thin metal layer Justin K. Brask, Mark L. Doczy, Jack T. Kavalieros, Uday Shah, Matthew V. Metz +1 more 2006-10-31
7056780 Etching metal silicides and germanides Justin K. Brask 2006-06-06
7045428 Method for making a semiconductor device with a high-k gate dielectric and a conductor that facilitates current flow across a P/N junction Justin K. Brask, Jack T. Kavalieros, Mark L. Doczy, Matthew V. Metz, Uday Shah +3 more 2006-05-16
7037845 Selective etch process for making a semiconductor device having a high-k gate dielectric Justin K. Brask, Uday Shah, Mark L. Doczy, Jack T. Kavalieros, Robert S. Chau +1 more 2006-05-02
7022655 Highly polar cleans for removal of residues from semiconductor structures Justin K. Brask, Vijayakumar Ramachandrarao 2006-04-04
6974764 Method for making a semiconductor device having a metal gate electrode Justin K. Brask, Mark L. Doczy, Jack T. Kavalieros, Uday Shah, Matthew V. Metz +1 more 2005-12-13
6896774 Acoustic streaming of condensate during sputtered metal vapor deposition Justin K. Brask, Mark L. Doczy 2005-05-24
6812132 Filling small dimension vias using supercritical carbon dioxide Vijayakumar Ramachandrarao 2004-11-02
6624127 Highly polar cleans for removal of residues from semiconductor structures Justin K. Brask, Vijayakumar Ramachandrarao 2003-09-23