JF

Jürgen Frosien

AD Advantest: 15 patents #43 of 1,193Top 4%
SA Siemens Aktiengesellschaft: 5 patents #2,766 of 22,248Top 15%
Applied Materials: 3 patents #2,994 of 7,310Top 45%
TD Technische Universiteit Delft: 2 patents #39 of 311Top 15%
📍 Riemerling, DE: #2 of 60 inventorsTop 4%
Overall (All Time): #34,495 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 26–50 of 64 patents

Patent #TitleCo-InventorsDate
7638777 Imaging system with multi source array Hans-Peter Feuerbaum, Uli Hoffmann, Dieter Winkler, Pavel Adamec 2009-12-29
7633074 Arrangement and method for compensating emitter tip vibrations 2009-12-15
7595490 Charged particle beam emitting device and method for operating a charged particle beam emitting device Fang Zhou, Pavel Adamec, Jimmy Vishnipolsky 2009-09-29
7507956 Charged particle beam energy width reduction system for charged particle beam system Ralf Degenhardt, Stefan Lanio 2009-03-24
7468517 Single stage charged particle beam energy width reduction system for charged particle beam system Ralf Degenhardt, Stefan Lanio, Gerald Schonecker 2008-12-23
7326927 Focusing lens and charged particle beam device for titled landing angle operation 2008-02-05
7253417 Multi-axis compound lens, beam system making use of the compound lens, and method using the compound lens Pavel Adamec 2007-08-07
6720557 Particle beam apparatus 2004-04-13
6667478 Particle beam apparatus Stefan Lanio 2003-12-23
6509969 System for inspecting and/or processing a sample Shinpei Takeshita 2003-01-21
6509569 Deflection arrangement for separating two particle beams 2003-01-21
6489621 Particle beam system with a device for reducing the energy width of a particle beam 2002-12-03
6459283 Method and system for testing an electrical component Reinhold Schmitt 2002-10-01
6429427 Method and apparatus for surface imaging 2002-08-06
6407388 Corpuscular beam device 2002-06-18
6407387 Particle beam apparatus Stefan Lanio 2002-06-18
6232601 Dynamically compensated objective lens-detection device and method Reinhold Schmitt, Stefan Lanio, Gerald Schonecker 2001-05-15
6182605 Apparatus for particle beam induced modification of a specimen 2001-02-06
6107633 Electron beam lens Stefan Lanio, Gerald Schonecker 2000-08-22
6104034 Objective lens Stefan Lanio, Gerald Schonecker 2000-08-15
6093512 Method and apparatus for dimension measurement and inspection of structures utilizing corpuscular beam Akira Kintaka 2000-07-25
6051838 Optical unit Stefan Lanio, Reinhold Schmitt, Gerald Schonecker 2000-04-18
5895917 Detector objective lens Koshi Ueda, Toshimichi Iwai, Gerald Schonecker 1999-04-20
5895919 Gun lens for generating a particle beam Stefan Lanio, Gerald Schonecker 1999-04-20
5885354 Method and apparatus for processing a specimen Dieter Winkler, Hans-Peter Zimmermann 1999-03-23