Issued Patents All Time
Showing 51–75 of 83 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8560989 | Statistical clock cycle computation | Nathan C. Buck, Brian M. Dreibelbis, John P. Dubuque, Eric A. Foreman, James C. Gregerson +6 more | 2013-10-15 |
| 8560980 | Optimal chip acceptance criterion and its applications | Jinjun Xiong | 2013-10-15 |
| 8560994 | Enabling statistical testing using deterministic multi-corner timing analysis | Bhavna Agrawal, David S. Kung, Jinjun Xiong | 2013-10-15 |
| 8538715 | Design-dependent integrated circuit disposition | Peter A. Habitz, Jinjun Xiong | 2013-09-17 |
| 8510696 | Ordering of statistical correlated quantities | Chandramouli Visweswariah, Jinjun Xiong | 2013-08-13 |
| 8468483 | Method, system and program storage device for performing a parameterized statistical static timing analysis (SSTA) of an integrated circuit taking into account setup and hold margin interdependence | Nathan C. Buck, Brian M. Dreibelbis, John P. Dubuque, Eric A. Foreman, Peter A. Habitz +4 more | 2013-06-18 |
| 8418107 | Performing statistical timing analysis with non-separable statistical and deterministic variations | Jeffrey G. Hemmett, Debjit Sinha, Natesan Venkateswaran, Chandramouli Visweswariah | 2013-04-09 |
| 8413095 | Statistical single library including on chip variation for rapid timing and power analysis | John P. Dubuque, Eric A. Foreman, Peter A. Habitz, Jeffrey G. Hemmett, Amol A. Joshi +2 more | 2013-04-02 |
| 8381150 | Method for performing a parallel static timing analysis using thread-specific sub-graphs | David J. Hathaway, Kerim Kalafala, Mark A. Lavin, Peihua Qi | 2013-02-19 |
| 8359565 | Method and apparatus for generating test patterns for use in at-speed testing | Chandramouli Visweswariah, Jinjun Xiong | 2013-01-22 |
| 8340939 | Method and apparatus for selecting paths for use in at-speed testing | Yiyu Shi, Chandramouli Visweswariah, Jinjun Xiong | 2012-12-25 |
| 8266565 | Ordering of statistical correlated quantities | Chandramouli Visweswariah, Jinjun Xiong | 2012-09-11 |
| 8176462 | Method and apparatus for generating test patterns for use in at-speed testing | Chandramouli Visweswariah, Jinjun Xiong | 2012-05-08 |
| 8141025 | Method of performing timing analysis on integrated circuit chips with consideration of process variations | Debjit Sinha, Eric A. Foreman, Peter A. Habitz, Natesan Venkateswaran, Chandramouli Visweswariah | 2012-03-20 |
| 8104005 | Method and apparatus for efficient incremental statistical timing analysis and optimization | Debjit Sinha, Natesan Venkateswaran, Chandramouli Visweswariah, Jinjun Xiong | 2012-01-24 |
| 8086976 | Methods for statistical slew propagation during block-based statistical static timing analysis | Jeffrey G. Hemmett, Chandramouli Visweswariah | 2011-12-27 |
| 8015525 | System and method for accommodating non-gaussian and non-linear sources of variation in statistical static timing analysis | Hongliang Chang, Sambasivan Narayan, Chandramouli Visweswariah | 2011-09-06 |
| 7971120 | Method and apparatus for covering a multilayer process space during at-speed testing | Yiyu Shi, Chandramouli Visweswariah, Jinjun Xiong | 2011-06-28 |
| 7886247 | Method and apparatus for statistical path selection for at-speed testing | Hanif Fatemi, Chandramouli Visweswariah, Jinjun Xiong | 2011-02-08 |
| 7873925 | Method and apparatus for computing test margins for at-speed testing | Chandramouli Visweswariah, Jinjun Xiong | 2011-01-18 |
| 7861199 | Method and apparatus for incrementally computing criticality and yield gradient | Chandramouli Visweswariah, Jinjun Xiong | 2010-12-28 |
| 7856607 | System and method for generating at-speed structural tests to improve process and environmental parameter space coverage | Gary D. Grise, Peter A. Habitz, Vikram Iyengar, David E. Lackey, Chandramouli Visweswariah | 2010-12-21 |
| 7849429 | Methods for conserving memory in statistical static timing analysis | Jeffrey G. Hemmett, Natesan Venkateswaran, Chandramouli Visweswariah | 2010-12-07 |
| 7814448 | Representing and propagating a variational voltage waveform in statistical static timing analysis of digital circuits | Soroush Abbaspour, David J. Hathaway, Chandramouli Visweswariah, Jinjun Xiong | 2010-10-12 |
| 7620921 | IC chip at-functional-speed testing with process coverage evaluation | Eric A. Foreman, Gary D. Grise, Peter A. Habitz, Vikram Iyengar, David E. Lackey +2 more | 2009-11-17 |