Issued Patents All Time
Showing 51–75 of 120 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10090400 | Gate-all-around fin device | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2018-10-02 |
| 10037895 | Structures, methods and applications for electrical pulse anneal processes | Michel J. Abou-Khalil, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam +1 more | 2018-07-31 |
| 10008491 | Low capacitance electrostatic discharge (ESD) devices | You Li, Robert J. Gauthier, Jr., Mickey H. Yu | 2018-06-26 |
| 9978874 | Gate-all-around fin device | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2018-05-22 |
| 9923096 | Gate-all-around fin device | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2018-03-20 |
| 9911852 | Gate-all-around fin device | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2018-03-06 |
| 9881810 | Structures, methods and applications for electrical pulse anneal processes | Michel J. Abou-Khalil, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam +1 more | 2018-01-30 |
| 9869708 | Integrated circuit protection during high-current ESD testing | Shunhua T. Chang, James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack | 2018-01-16 |
| 9818542 | Gate-all-around fin device | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2017-11-14 |
| 9704852 | Electrostatic discharge and passive structures integrated in a vertical gate fin-type field effect diode | Robert J. Gauthier, Jr., Tom C. Lee, You Li, Rahul Mishra, Andreas Scholze | 2017-07-11 |
| 9620497 | Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) drivers | James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack, Junjun Li | 2017-04-11 |
| 9590108 | Gate-all-around fin device | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2017-03-07 |
| 9575115 | Methodology of grading reliability and performance of chips across wafer | Nathaniel R. Chadwick, James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li +2 more | 2017-02-21 |
| 9536870 | SCR with fin body regions for ESD protection | James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam | 2017-01-03 |
| 9453878 | Characterization of interface resistance in a multi-layer conductive structure | John B. Campi, Jr., Robert J. Gauthier, Jr., Junjun Li | 2016-09-27 |
| 9435841 | Integrated circuit protection during high-current ESD testing | Shunhua T. Chang, James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack | 2016-09-06 |
| 9431388 | Series-connected nanowire structures | Robert J. Gauthier, Jr., Terence B. Hook | 2016-08-30 |
| 9425185 | Self-healing electrostatic discharge power clamp | Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, You Li | 2016-08-23 |
| 9413169 | Electrostatic discharge protection circuit with a fail-safe mechanism | James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam | 2016-08-09 |
| 9397163 | Gate-all-around fin device | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2016-07-19 |
| 9391065 | Electrostatic discharge and passive structures integrated in a vertical gate fin-type field effect diode | Robert J. Gauthier, Jr., Tom C. Lee, You Li, Rahul Mishra, Andreas Scholze | 2016-07-12 |
| 9349732 | High voltage lateral double-diffused metal oxide semiconductor field effect transistor (LDMOSFET) having a deep fully depleted drain drift region | John B. Campi, Jr., Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra, Mujahid Muhammad | 2016-05-24 |
| 9281379 | Gate-all-around fin device | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2016-03-08 |
| 9240471 | SCR with fin body regions for ESD protection | James P. Di Sarro, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam | 2016-01-19 |
| 9236374 | Fin contacted electrostatic discharge (ESD) devices with improved heat distribution | John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad | 2016-01-12 |