SC

Shunhua T. Chang

IBM: 21 patents #5,175 of 70,183Top 8%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
📍 South Burlington, VT: #107 of 1,136 inventorsTop 10%
🗺 Vermont: #354 of 4,968 inventorsTop 8%
Overall (All Time): #195,222 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
10636872 Apparatus and method to prevent integrated circuit from entering latch-up mode Ephrem G. Gebreselasie, Mujahid Muhammad, Xiangxiang Lu, Mickey H. Yu 2020-04-28
10359461 Integrated circuit protection during high-current ESD testing James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack, Souvick Mitra 2019-07-23
9869708 Integrated circuit protection during high-current ESD testing James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack, Souvick Mitra 2018-01-16
9684029 Transmission line pulse and very fast transmission line pulse reflection control Robert J. Gauthier, Jr., Evan Grund 2017-06-20
9435841 Integrated circuit protection during high-current ESD testing James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack, Souvick Mitra 2016-09-06
9377496 Cancellation of secondary reverse reflections in a very-fast transmission line pulse system James P. Di Sarro, Robert J. Gauthier, Jr. 2016-06-28
9274155 Cancellation of secondary reverse reflections in a very-fast transmission line pulse system James P. Di Sarro, Robert J. Gauthier, Jr. 2016-03-01
8803276 Electrostatic discharge (ESD) device and method of fabricating Kiran V. Chatty, Robert J. Gauthier, Jr., Mujahid Muhammad 2014-08-12
8796731 Low leakage, low capacitance electrostatic discharge (ESD) silicon controlled recitifer (SCR), methods of manufacture and design structure Michel J. Abou-Khalil, Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Mujahid Muhammad 2014-08-05
8760827 Robust ESD protection circuit, method and design structure for tolerant and failsafe designs John B. Campi, Jr., Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Mujahid Muhammad 2014-06-24
8730624 Electrostatic discharge power clamp with a JFET based RC trigger circuit Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra, Mujahid Muhammad 2014-05-20
8634172 Silicon controlled rectifier based electrostatic discharge protection circuit with integrated JFETs, method of operation and design structure John B. Campi, Jr., Kiran V. Chatty, Robert J. Gauthier, Jr., Mujahid Muhammad 2014-01-21
8614489 Vertical NPNP structure in a triple well CMOS process John B. Campi, Jr., Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra +1 more 2013-12-24
8597993 Electrostatic discharge (ESD) device and method of fabricating Kiran V. Chatty, Robert J. Gauthier, Jr., Mujahid Muhammad 2013-12-03
8513738 ESD field-effect transistor and integrated diffusion resistor John B. Campi, Jr., Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra +1 more 2013-08-20
8363367 Electrical overstress protection circuit John B. Campi, Jr., Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Mujahid Muhammad 2013-01-29
8354722 SCR/MOS clamp for ESD protection of integrated circuits John B. Campi, Jr., Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra +1 more 2013-01-15
8350329 Low trigger voltage electrostatic discharge NFET in triple well CMOS technology John B. Campi, Jr., Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra +1 more 2013-01-08
8299533 Vertical NPNP structure in a triple well CMOS process John B. Campi, Jr., Kiran V. Chatty, Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra +1 more 2012-10-30
8169760 Signal and power supply integrated ESD protection device Kiran V. Chatty, Robert J. Gauthier, Jr., Mujahid Muhammad 2012-05-01
7648869 Method of fabricating semiconductor structures for latch-up suppression Toshiharu Furukawa, Robert J. Gauthier, Jr., David V. Horak, Charles W. Koburger, III, Jack A. Mandelman +1 more 2010-01-19
7385275 Shallow trench isolation method for shielding trapped charge in a semiconductor device Ethan H. Cannon, Toshiharu Furukawa, David V. Horak, Charles W. Koburger, III 2008-06-10