| 12353817 |
Pcell verification |
Alain Loiseau, Romain H.A. Feuillette |
2025-07-08 |
| 11141902 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2021-10-12 |
| 11130270 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2021-09-28 |
| 10974433 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2021-04-13 |
| 10940627 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2021-03-09 |
| 10770594 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2020-09-08 |
| 10658514 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2020-05-19 |
| 10636872 |
Apparatus and method to prevent integrated circuit from entering latch-up mode |
Shunhua T. Chang, Ephrem G. Gebreselasie, Xiangxiang Lu, Mickey H. Yu |
2020-04-28 |
| 10593805 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2020-03-17 |
| 10573754 |
Gate-all around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2020-02-25 |
| 10388793 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2019-08-20 |
| 10381483 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2019-08-13 |
| 10381484 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2019-08-13 |
| 10347622 |
Silicon-controlled rectifiers having a cathode coupled by a contact with a diode trigger |
You Li, Manjunatha Prabu, John B. Campi, Jr., Robert J. Gauthier, Jr., Souvick Mitra |
2019-07-09 |
| 10283959 |
ESD state-controlled semiconductor-controlled rectifier |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2019-05-07 |
| 10147822 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2018-12-04 |
| 10090400 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2018-10-02 |
| 10090301 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2018-10-02 |
| 9978874 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2018-05-22 |
| 9923096 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2018-03-20 |
| 9911852 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2018-03-06 |
| 9818542 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2017-11-14 |
| 9590108 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2017-03-07 |
| 9397163 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Souvick Mitra |
2016-07-19 |
| 9349732 |
High voltage lateral double-diffused metal oxide semiconductor field effect transistor (LDMOSFET) having a deep fully depleted drain drift region |
John B. Campi, Jr., Robert J. Gauthier, Jr., Junjun Li, Rahul Mishra, Souvick Mitra |
2016-05-24 |
