RL

Robert K. Leidy

IBM: 97 patents #597 of 70,183Top 1%
Globalfoundries: 11 patents #330 of 4,424Top 8%
GU Globalfoundries U.S.: 2 patents #206 of 665Top 35%
📍 Burlington, VT: #6 of 475 inventorsTop 2%
🗺 Vermont: #48 of 4,968 inventorsTop 1%
Overall (All Time): #11,954 of 4,157,543Top 1%
110
Patents All Time

Issued Patents All Time

Showing 26–50 of 110 patents

Patent #TitleCo-InventorsDate
8881072 Method for compensating for variations in structures of an integrated circuit Santo Credendino, Michael D. Hulvey, Jothimalar Kuppusamy, Paul William Pastel, Bruce W. Porth +1 more 2014-11-04
8878326 Imager microlens structure having interfacial region for adhesion of protective layer Edward C. Cooney, III, Jeffrey P. Gambino, Charles F. Musante, John G. Twombly 2014-11-04
8753917 Method of fabricating photoconductor-on-active pixel device Jeffrey P. Gambino, Richard J. Rassel 2014-06-17
8647913 Image sensor, method and design structure including non-planar reflector James W. Adkisson, Jeffrey P. Gambino, John J. Ellis-Monaghan 2014-02-11
8618588 Anti-blooming pixel sensor cell with active neutral density filter, methods of manufacture, and design structure Kristin M. Ackerson, Jeffrey P. Gambino, Mark D. Jaffe, Richard J. Rassel, Robert M. Rassel 2013-12-31
8592244 Pixel sensor cells and methods of manufacturing Jeffrey P. Gambino, Mark D. Levy 2013-11-26
8546230 Bipolar transistor with a collector having a protected outer edge portion for reduced based-collector junction capacitance and a method of forming the transistor James W. Adkisson, David L. Harame, Qizhi Liu 2013-10-01
8536025 Resized wafer with a negative photoresist ring and design structures thereof Dennis P. Hogan, Gregory S. Jankowski 2013-09-17
8476099 Methods for improved adhesion of protective layers of imager microlens structures by forming an interfacial region Edward C. Cooney, III, Jeffrey P. Gambino, Charles F. Musante, John G. Twombly 2013-07-02
8456625 Methods for real-time contamination, environmental, or physical monitoring of a photomask Brent A. Anderson, Jed H. Rankin 2013-06-04
8458628 Method for compensating for variations in structures of an integrated circuit Santo Credendino, Michael D. Hulvey, Jothimalar Kuppusamy, Paul William Pastel, Bruce W. Porth +1 more 2013-06-04
8450822 Thick bond pad for chip with cavity package Jeffrey P. Gambino, Richard J. Rassel 2013-05-28
8409899 Delamination and crack resistant image sensor structures and methods Jeffrey P. Gambino, Mark D. Jaffe, Charles F. Musante, Richard J. Rassel 2013-04-02
8394718 Methods of forming self-aligned through silicon via Jeffrey P. Gambino, Anthony K. Stamper 2013-03-12
8299554 Image sensor, method and design structure including non-planar reflector James W. Adkisson, Jeffrey P. Gambino, John J. Ellis-Monaghan 2012-10-30
8217259 Enhanced efficiency solar cells and method of manufacture Jeffrey P. Gambino, Scott W. Jones, Mark J. Pouliot 2012-07-10
8176446 Method for compensating for variations in structures of an integrated circuit Santo Credendino, Michael D. Hulvey, Jothimalar Kuppusamy, Paul William Pastel, Bruce W. Porth +1 more 2012-05-08
8168474 Self-dicing chips using through silicon vias James W. Adkisson, Panglijen Candra, Thomas J. Dunbar, Jeffrey P. Gambino, Mark D. Jaffe +1 more 2012-05-01
8136055 Systems for real-time contamination, environmental, or physical monitoring of a photomask Brent A. Anderson, Jed H. Rankin 2012-03-13
8006211 IC chip and design structure including stitched circuitry region boundary identification Kevin N. Ogg, Richard J. Rassel, Jeanne-Tania Sucharitaves 2011-08-23
8003428 Method of forming an inverted lens in a semiconductor structure Terence W. Barrett, Jeffrey P. Gambino 2011-08-23
7958482 Stitched circuitry region boundary identification for stitched IC chip layout Kevin N. Ogg, Richard J. Rassel, Jeanne-Tania Sucharitaves 2011-06-07
7935604 Method of making small geometry features James W. Adkisson, Jeffrey P. Gambino, Walter V. Lepuschenko, David Alan Meatyard, Stephen A. Mongeon +1 more 2011-05-03
7929117 Apparatus for real-time contamination, environmental, or physical monitoring of a photomask Brent A. Anderson, Jed H. Rankin 2011-04-19
7928527 Delamination and crack resistant image sensor structures and methods Jeffrey P. Gambino, Mark D. Jaffe, Charles F. Musante, Richard J. Rassel 2011-04-19