| 9916896 |
Ternary content addressable memory (TCAM) for multi bit miss detect circuit |
Igor Arsovski, Robert M. Houle, Akhilesh Patil, Van Butler |
2018-03-13 |
| 9859006 |
Algorithmic N search/M write ternary content addressable memory (TCAM) |
Igor Arsovski, Robert M. Houle |
2018-01-02 |
| 9704575 |
Content-addressable memory having multiple reference matchlines to reduce latency |
Igor Arsovski, Robert M. Houle, Thomas M. Maffitt |
2017-07-11 |
| 9601200 |
TCAM structures with reduced power supply noise |
Igor Arsovski, Thomas M. Maffitt |
2017-03-21 |
| 9583192 |
Matchline precharge architecture for self-reference matchline sensing |
Igor Arsovski, Thomas M. Maffitt, Robert M. Houle |
2017-02-28 |
| 8929116 |
Two phase search content addressable memory with power-gated main-search |
Igor Arsovski, Travis R. Hebig |
2015-01-06 |
| 8917566 |
Bypass structure for a memory device and method to reduce unknown test values |
Aaron Cummings, Kevin W. Gorman, Kelly A. Ockunzzi, Michael R. Ouellette |
2014-12-23 |
| 8233302 |
Content addressable memory with concurrent read and search/compare operations at the same memory cell |
Igor Arsovski, Rahul K. Nadkarni, Reid A. Wistort |
2012-07-31 |
| 7986571 |
Low power, single-ended sensing in a multi-port SRAM using pre-discharged bit lines |
Igor Arsovski, Robert M. Houle |
2011-07-26 |
| 7940581 |
Method for low power sensing in a multi-port SRAM using pre-discharged bit lines |
Igor Arsovski, Robert M. Houle |
2011-05-10 |
| 7924588 |
Content addressable memory with concurrent two-dimensional search capability in both row and column directions |
Igor Arsovski, Rahul K. Nadkarni, Reid A. Wistort |
2011-04-12 |
| 7859921 |
Apparatus and method for low power sensing in a multi-port SRAM using pre-discharged bit lines |
Igor Arsovski, Robert M. Houle |
2010-12-28 |
| 7830727 |
Apparatus and method for low power, single-ended sensing in a multi-port SRAM using pre-discharged bit lines |
Igor Arsovski, Robert M. Houle |
2010-11-09 |
| 7609569 |
System and method for implementing row redundancy with reduced access time and reduced device area |
Harold Pilo |
2009-10-27 |
| 7210085 |
Method and apparatus for test and repair of marginally functional SRAM cells |
Ciaran J. Brennan, Steven M. Eustis, Michael R. Ouellette, Neelesh Pai, Jeremy Rowland +2 more |
2007-04-24 |
| 6961276 |
Random access memory having an adaptable latency |
Francois Ibrahim Atallah, James Norris Dieffenderfer, Jeffrey Herbert Fischer, Daniel Stephen Geise, Jeffery H. Oppold +5 more |
2005-11-01 |
| 6944075 |
Variable column redundancy region boundaries in SRAM |
Steven M. Eustis, Michael R. Ouellette |
2005-09-13 |
| 6442085 |
Self-Test pattern to detect stuck open faults |
Jeffery H. Oppold, Michael R. Ouellette, Jeremy Rowland |
2002-08-27 |
