Issued Patents All Time
Showing 26–50 of 63 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9258157 | Method and system for mapping bit sequences | Baoming Bai, Yajuan LUO | 2016-02-09 |
| 9067323 | Device used for capturing micro-particles and a micro-particles transporting equipment provided with the device thereof | Xiaomin Cheng, Hongchao Fan | 2015-06-30 |
| 8855619 | Method for state transition and network device | Xueliang Wang, Zongquan Tang, Zhichao Shen | 2014-10-07 |
| 8736275 | Alignment correction system and method of use | Robert J. Foster, Shahin Zangooie, Roger M. Young, Clemente Bottini | 2014-05-27 |
| 8680871 | Alignment correction system and method of use | Robert J. Foster, Shahin Zangooie, Roger M. Young, Clemente Bottini | 2014-03-25 |
| 8594006 | Setting up a multicast group communication session within a wireless communications system | Bongyong Song, Yih-Hao Lin | 2013-11-26 |
| 8451008 | Alignment correction system and method of use | Robert J. Foster, Shahin Zangodie, Roger M. Young, Clemente Bottini | 2013-05-28 |
| 8411270 | Monitoring stage alignment and related stage and calibration target | Shahin Zangooie, Roger M. Young, Clemente Bottini, Ronald D. Fiege | 2013-04-02 |
| 8144872 | System and method for generating analog-digital mixed chaotic signal, encryption communication method thereof | Hanping Hu, Zuxi Wang, Xiaogang Wu, Ziqi Zhu, Jiwei Wei +3 more | 2012-03-27 |
| 8080849 | Characterizing films using optical filter pseudo substrate | Shahin Zangooie, Sean D. Burns | 2011-12-20 |
| 7831395 | Quantification of adsorbed molecular contaminant using thin film measurement | Eric P. Solecky | 2010-11-09 |
| 7808657 | Wafer and stage alignment using photonic devices | Shahin Zangooie | 2010-10-05 |
| 7742160 | Determining angle of incidence with respect to workpiece | Clemente Bottini, Ronald D. Fiege, Roger M. Young, Shahin Zangooie | 2010-06-22 |
| 7716009 | Metrology tool recipe validator using best known methods | Ejaj Ahmed, Charles N. Archie, Stephen W. Goodrich, Eric P. Solecky, Georgios A. Vakas +1 more | 2010-05-11 |
| 7646491 | Determining azimuth angle of incident beam to wafer | Shahin Zangooie, Roger M. Young, Clemente Bottini, Ronald D. Fiege | 2010-01-12 |
| 7592817 | Alignment correction system and method of use | Robert J. Foster, Shahin Zangooie, Roger M. Young, Clemente Bottini | 2009-09-22 |
| 7569112 | Scanning probe apparatus with in-situ measurement probe tip cleaning capability | Dmitriy Shneyder | 2009-08-04 |
| 7567179 | Configuration management system and method for use in an RFID system including a multiplicity of RFID readers | Robert A. Stephensen, Michael Jason Grady, Scott Barvick, David J. Husak, Nirav Shah +3 more | 2009-07-28 |
| 7542136 | Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput | Shahin Zangooie, Roger M. Young, Clemente Bottini, Robert J. Foster, Ronald D. Fiege | 2009-06-02 |
| 7535349 | Determining root cause for alarm in processing system | Dmitriy Shneyder, Stephen W. Goodrich, Joseph J. Mezzapelle | 2009-05-19 |
| 7532867 | Transceiver architecture for supporting multi-band RF | Shih Hsiung Mo, Junjie Yang, Chung-Hsing Chang, Ted Hsiung | 2009-05-12 |
| 7485859 | Charged beam apparatus and method that provide charged beam aerial dimensional map | Eric P. Solecky | 2009-02-03 |
| 7479396 | Structure, system and method for dimensionally unstable layer dimension measurement | Eric P. Solecky | 2009-01-20 |
| 7477365 | Optical spot geometric parameter determination using calibration targets | Shahin Zangooie, Roger M. Young, Clemente Bottini, Ronald D. Fiege | 2009-01-13 |
| 7397252 | Measurement of critical dimension and quantification of electron beam size at real time using electron beam induced current | Eric P. Solecky | 2008-07-08 |