DE

Daniel C. Edelstein

IBM: 293 patents #76 of 70,183Top 1%
TE Tessera: 8 patents #54 of 271Top 20%
Globalfoundries: 6 patents #578 of 4,424Top 15%
GU Globalfoundries U.S.: 2 patents #5 of 211Top 3%
CF Cornell Research Foundation: 2 patents #418 of 1,638Top 30%
Infineon Technologies Ag: 2 patents #3,160 of 7,486Top 45%
TC Toshiba America Electronic Components: 2 patents #14 of 77Top 20%
AM AMD: 2 patents #3,994 of 9,279Top 45%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Applied Materials: 1 patents #4,780 of 7,310Top 70%
📍 White Plains, NY: #2 of 917 inventorsTop 1%
🗺 New York: #53 of 115,490 inventorsTop 1%
Overall (All Time): #1,168 of 4,157,543Top 1%
312
Patents All Time

Issued Patents All Time

Showing 51–75 of 312 patents

Patent #TitleCo-InventorsDate
10204856 Interconnect structures with fully aligned vias Nicholas C. M. Fuller, Elbert E. Huang, Satyanarayana V. Nitta, David L. Rath 2019-02-12
10177092 Formation of advanced interconnects Chih-Chao Yang 2019-01-08
10177089 Advanced E-fuse structure with controlled microstructure Chih-Chao Yang 2019-01-08
10170424 Cobalt first layer advanced metallization for interconnects Chih-Chao Yang 2019-01-01
10163793 Cobalt first layer advanced metallization for interconnects Chih-Chao Yang 2018-12-25
10134675 Cobalt top layer advanced metallization for interconnects Chih-Chao Yang 2018-11-20
10128186 Simultaneous formation of liner and metal conductor Chih-Chao Yang 2018-11-13
10121740 Advanced e-Fuse structure with hybrid metal controlled microstructure Chih-Chao Yang 2018-11-06
10115670 Formation of advanced interconnects including set of metal conductor structures in patterned dielectric layer Chih-Chao Yang 2018-10-30
10109585 Formation of advanced interconnects including a set of metal conductor structures in a patterned dielectric layer Chih-Chao Yang 2018-10-23
10109675 Forming self-aligned contacts on pillar structures Anthony J. Annunziata, Eugene J. O'Sullivan, Henry K. Utomo 2018-10-23
10032716 Advanced E-fuse structure with controlled microstructure Chih-Chao Yang 2018-07-24
10020358 Metal resistors having nitridized dielectric surface layers and nitridized metal surface layers Chih-Chao Yang 2018-07-10
10008446 Advanced E-fuse structure with enhanced electromigration fuse element Chih-Chao Yang 2018-06-26
9997460 Formation of advanced interconnects Chih-Chao Yang 2018-06-12
9991330 Resistors with controlled resistivity Chih-Chao Yang 2018-06-05
9985088 Metal resistors having nitridized metal surface layers with different nitrogen content Chih-Chao Yang 2018-05-29
9972672 Tunable resistor with curved resistor elements Chih-Chao Yang 2018-05-15
9972671 Metal resistors having varying resistivity Chih-Chao Yang 2018-05-15
9953950 Nitride-enriched oxide-to-oxide 3D wafer bonding Chih-Chao Yang 2018-04-24
9947579 Copper interconnect structure with manganese oxide barrier layer Son V. Nguyen, Takeshi Nogami, Deepika Priyadarshini, Hosadurga Shobha 2018-04-17
9947655 3D bonded semiconductor structure with an embedded capacitor Chih-Chao Yang 2018-04-17
9947622 Ultrathin superlattice of MnO/Mn/MnN and other metal oxide/metal/metal nitride liners and caps for copper low dielectric constant interconnects Donald F. Canaperi, Alfred Grill, Son V. Nguyen, Takeshi Nogami, Deepika Priyadarshini +1 more 2018-04-17
9947581 Method of forming a copper based interconnect structure Son V. Nguyen, Takeshi Nogami, Deepika Priyadarshini, Hosadurga Shobha 2018-04-17
9941241 Method for wafer-wafer bonding Chih-Chao Yang 2018-04-10