DE

Daniel C. Edelstein

IBM: 293 patents #76 of 70,183Top 1%
TE Tessera: 8 patents #54 of 271Top 20%
Globalfoundries: 6 patents #578 of 4,424Top 15%
GU Globalfoundries U.S.: 2 patents #5 of 211Top 3%
CF Cornell Research Foundation: 2 patents #418 of 1,638Top 30%
Infineon Technologies Ag: 2 patents #3,160 of 7,486Top 45%
TC Toshiba America Electronic Components: 2 patents #14 of 77Top 20%
AM AMD: 2 patents #3,994 of 9,279Top 45%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Applied Materials: 1 patents #4,780 of 7,310Top 70%
📍 White Plains, NY: #2 of 917 inventorsTop 1%
🗺 New York: #53 of 115,490 inventorsTop 1%
Overall (All Time): #1,168 of 4,157,543Top 1%
312
Patents All Time

Issued Patents All Time

Showing 76–100 of 312 patents

Patent #TitleCo-InventorsDate
9941213 Nitridized ruthenium layer for formation of cobalt interconnects Chih-Chao Yang 2018-04-10
9941212 Nitridized ruthenium layer for formation of cobalt interconnects Chih-Chao Yang 2018-04-10
9911690 Interconnect structures with fully aligned vias Nicholas C. M. Fuller, Elbert E. Huang, Satyanarayana V. Nitta, David L. Rath 2018-03-06
9905667 Lateral bipolar transistor Fabio Carta, Stephen M. Gates, Bahman Hekmatshoartabari, Tak H. Ning 2018-02-27
9893012 Advanced e-fuse structure with hybrid metal controlled microstructure Chih-Chao Yang 2018-02-13
9870993 Simultaneous formation of liner and metal conductor Chih-Chao Yang 2018-01-16
9859433 Cobalt top layer advanced metallization for interconnects Chih-Chao Yang 2018-01-02
9859215 Formation of advanced interconnects Chih-Chao Yang 2018-01-02
9859209 Advanced e-Fuse structure with enhanced electromigration fuse element Chih-Chao Yang 2018-01-02
9859155 Cobalt first layer advanced metallization for interconnects Chih-Chao Yang 2018-01-02
9852990 Cobalt first layer advanced metallization for interconnects Chih-Chao Yang 2017-12-26
9831181 Simultaneous formation of liner and metal conductor Chih-Chao Yang 2017-11-28
9824917 Method and apparatus for single chamber treatment Chih-Chao Yang 2017-11-21
9812391 Advanced metallization for damage repair Chih-Chao Yang 2017-11-07
9806024 Simultaneous formation of liner and metal conductor Chih-Chao Yang 2017-10-31
9799605 Advanced copper interconnects with hybrid microstructure Chih-Chao Yang 2017-10-24
9786605 Advanced through substrate via metallization in three dimensional semiconductor integration Chih-Chao Yang 2017-10-10
9773737 Advanced metallization for damage repair Chih-Chao Yang 2017-09-26
9761529 Advanced metallization for damage repair Chih-Chao Yang 2017-09-12
9728399 Simultaneous formation of liner and metal conductor Chih-Chao Yang 2017-08-08
9721835 Modulating microstructure in interconnects Chih-Chao Yang 2017-08-01
9721788 Simultaneous formation of liner and metal conductor Chih-Chao Yang 2017-08-01
9716088 3D bonded semiconductor structure with an embedded capacitor Chih-Chao Yang 2017-07-25
9716063 Cobalt top layer advanced metallization for interconnects Chih-Chao Yang 2017-07-25
9702042 Method and apparatus for single chamber treatment Chih-Chao Yang 2017-07-11