Issued Patents All Time
Showing 26–50 of 86 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6977514 | Probe structure | Tatsuya Nagata, Hiroya Shimizu, Toshio Miyatake, Hideo Miura | 2005-12-20 |
| 6955870 | Method of manufacturing a semiconductor device | Hideo Miura, Masatoshi Kanamaru, Hiroya Shimizu, Hideyuki Aoki | 2005-10-18 |
| 6952110 | Testing apparatus for carrying out inspection of a semiconductor device | Hideo Miura, Masatoshi Kanamaru, Hiroya Shimizu, Hideyuki Aoki | 2005-10-04 |
| 6885208 | Semiconductor device and test device for same | Toshio Miyatake, Tatsuya Nagata, Hiroya Shimizu, Hideyuki Aoki | 2005-04-26 |
| 6880534 | Evaporative fuel processing system | Koichi Yoshiki, Kazuhiko Imamura, Mahito Shikama, Toshiichi Terakado, Kenichi Maeda +1 more | 2005-04-19 |
| 6876073 | Semiconductor device and contractor for inspection | Hideo Miura | 2005-04-05 |
| 6868109 | Space hopping receiving system and received radio-waves estimation method | Satoru Ishii | 2005-03-15 |
| 6864568 | Packaging device for holding a plurality of semiconductor devices to be inspected | Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Toshio Miyatake, Hideo Miura +4 more | 2005-03-08 |
| 6864695 | Semiconductor device testing apparatus and semiconductor device manufacturing method using it | Hideo Miura, Masatoshi Kanamaru, Hiroya Shimizu, Naoto Ban | 2005-03-08 |
| 6862442 | Receiver | Yukitoshi Sanada, Masayoshi Abe | 2005-03-01 |
| 6828810 | Semiconductor device testing apparatus and method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Hiroya Shimizu, Naoto Ban +1 more | 2004-12-07 |
| 6822508 | Communication device, communication method, program, and storage medium | Young Chul Yoon | 2004-11-23 |
| 6823181 | Universal platform for software defined radio | Masayoshi Abe, Noboru Sasho, Shinichiro Haruyama, Robert Morelos-Zaragoza, Francis Swarts +5 more | 2004-11-23 |
| 6784835 | Array antenna | Abreu Giuseppe | 2004-08-31 |
| 6778147 | Antenna apparatus | Yukitoshi Sanada | 2004-08-17 |
| 6774654 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Toshio Miyatake, Hideyuki Aoki +1 more | 2004-08-10 |
| 6768337 | Integrated circuit, method of circuit configuration and program thereof | Kenichiro Akai, Yukitoshi Sanada, Robert Morelos-Zaragoza, Lachlan Bruce Michael | 2004-07-27 |
| 6763062 | Radio communication system | Hiroki Mochizuki | 2004-07-13 |
| 6728294 | Radio communication system | Hiroki Mochizuki | 2004-04-27 |
| 6714030 | Semiconductor inspection apparatus | Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane, Hideyuki Aoki +1 more | 2004-03-30 |
| 6696849 | Fabrication method of semiconductor integrated circuit device and its testing apparatus | Naoto Ban, Masaaki Namba, Akio Hasebe, Yuji Wada, Akira Seito +1 more | 2004-02-24 |
| 6660541 | Semiconductor device and a manufacturing method thereof | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Hideyuki Aoki | 2003-12-09 |
| 6614246 | Probe structure | Tatsuya Nagata, Hiroya Shimizu, Toshio Miyatake, Hideo Miura | 2003-09-02 |
| 6611859 | Address setting method, client apparatus, server apparatus and client-server system | — | 2003-08-26 |
| 6573864 | Receiver | Yukitoshi Sanada, Masayoshi Abe | 2003-06-03 |