Issued Patents All Time
Showing 51–75 of 86 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6566150 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada, Naoto Ban +7 more | 2003-05-20 |
| 6548315 | Manufacture method for semiconductor inspection apparatus | Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane, Hideyuki Aoki +1 more | 2003-04-15 |
| 6531327 | Method for manufacturing semiconductor device utilizing semiconductor testing equipment | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Hideyuki Aoki +1 more | 2003-03-11 |
| 6522898 | Radio communication system | Hiroki Mochizuki | 2003-02-18 |
| 6507204 | Semiconductor testing equipment with probe formed on a cantilever of a substrate | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Hideyuki Aoki +1 more | 2003-01-14 |
| 6496023 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Toshio Miyatake, Hideyuki Aoki +1 more | 2002-12-17 |
| 6492829 | Contactor for inspection | Hideo Miura | 2002-12-10 |
| 6486830 | Directional antenna apparatus | Tomonori Sugiyama, Hiroki Mochizuki | 2002-11-26 |
| 6473055 | Directional antenna apparatus and mobile communication system using the same | Tomonori Sugiyama | 2002-10-29 |
| 6465264 | Method for producing semiconductor device and apparatus usable therein | Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Toshio Miyatake, Hideo Miura +4 more | 2002-10-15 |
| 6459409 | Method and device for using array antenna to estimate location of source in near field | Abreu Giuseppe | 2002-10-01 |
| 6455335 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada, Naoto Ban +7 more | 2002-09-24 |
| 6358762 | Manufacture method for semiconductor inspection apparatus | Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane, Hideyuki Aoki +1 more | 2002-03-19 |
| 6297073 | Semiconductor device | Makoto Kitano, Naotaka Tanaka, Akihiro Yaguchi, Tetsuo Kumazawa, Ichiro Anjoh +5 more | 2001-10-02 |
| 6244258 | EGR controller for cylinder cut-off engine | Eitetsu Akiyama, Toshiyuki Suzuki, Morio Fukuda | 2001-06-12 |
| 6232653 | TSOP type semiconductor device | Naotaka Tanaka, Akihiro Yaguchi, Kiyomi Kojima, Takeshi Terasaki, Hideo Miura +2 more | 2001-05-15 |
| 6197603 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada, Naoto Ban +7 more | 2001-03-06 |
| 6138636 | Apparatus for controlling multi-cylinder internal combustion engine with partial cylinder switching-off mechanism | Toshiyuki Suzuki, Eitetsu Akiyama, Morio Fukuda | 2000-10-31 |
| 6130112 | Semiconductor device | Makoto Kitano, Naotaka Tanaka, Akihiro Yaguchi, Tetsuo Kumazawa, Ichiro Anjoh +5 more | 2000-10-10 |
| 6049128 | Semiconductor device | Makoto Kitano, Naotaka Tanaka, Akihiro Yaguchi, Tetsuo Kumazawa, Ichiro Anjoh +5 more | 2000-04-11 |
| 5959571 | Radar device | Yasushi Aoyagi, Toshihide Fukuchi, Kiyoshi Inoue | 1999-09-28 |
| 5724041 | Spread spectrum radar device using pseudorandom noise signal for detection of an object | Kiyoshi Inoue, Haruhiko Ishizu | 1998-03-03 |
| 5635756 | Semiconductor device, lead frame therefor and memory card to provide a thin structure | Makoto Kitano, Asao Nishimura | 1997-06-03 |
| 5608265 | Encapsulated semiconductor device package having holes for electrically conductive material | Makoto Kitano, Asao Nishimura, Akihiro Yaguchi, Nae Yoneda, Naotaka Tanaka +1 more | 1997-03-04 |
| 5569960 | Electronic component, electronic component assembly and electronic component unit | Tetsuo Kumazawa, Makoto Kitano, Akihiro Yaguchi, Naotaka Tanaka, Nae Yoneda +1 more | 1996-10-29 |