SN

Shuichi Nakagawa

HH Hitachi High-Technologies: 31 patents #91 of 1,917Top 5%
RO Roland: 7 patents #26 of 292Top 9%
MC Minolta Co.: 7 patents #298 of 1,416Top 25%
MI Minolta: 4 patents #411 of 1,109Top 40%
YC Yanmar Power Technology Co.: 4 patents #19 of 202Top 10%
Fujitsu Limited: 3 patents #8,614 of 24,456Top 40%
YE Yokogawa Hokushin Electric: 3 patents #5 of 112Top 5%
Mitsubishi Electric: 2 patents #11,187 of 25,717Top 45%
SU Subaru: 2 patents #474 of 1,684Top 30%
YC Yanmar Holdings Co.: 1 patents #349 of 636Top 55%
Ricoh Company: 1 patents #6,936 of 9,818Top 75%
YW Yokogawa Electric Works: 1 patents #12 of 44Top 30%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
Overall (All Time): #31,771 of 4,157,543Top 1%
67
Patents All Time

Issued Patents All Time

Showing 26–50 of 67 patents

Patent #TitleCo-InventorsDate
D876412 Wireless transmitter Masato Ueno 2020-02-25
10366912 Stage apparatus and charged particle beam apparatus Motohiro TAKAHASHI, Masaki Mizuochi, Naruo Watanabe, Hironori Ogawa, Takanori Kato +1 more 2019-07-30
10153128 Charged particle beam apparatus and sample elevating apparatus Masakazu Sugaya, Yusuke Moriwaki, Koichi Terada, Nobuo Shibata, Hironori Ogawa +2 more 2018-12-11
9905393 Stage apparatus with braking system for lens, beam, or vibration compensation Hironori Ogawa, Masaki Mizuochi, Motohiro TAKAHASHI, Takanori Kato 2018-02-27
9887064 Stage device and charged particle beam device using the same Akira Nishioka, Masaki Mizuochi, Nobuyuki Maki 2018-02-06
9734983 Charged particle radiation apparatus Daisuke Mutou, Masaki Mizuochi, Toshihiko Shimizu, Hirofumi Motoshiromizu, Eisuke Kamide 2017-08-15
9666408 Apparatus and method for processing sample, and charged particle radiation apparatus Masaru Matsushima, Masakazu Takahashi, Seiichiro Kanno 2017-05-30
9627173 Stage device and charged particle beam apparatus using the stage device Hironori Ogawa, Masaki Mizuochi, Tsukasa Sugawara 2017-04-18
9502208 Charged particle beam apparatus, stage controlling method, and stage system Masaki Mizuochi, Akira Nishioka, Hironori Ogawa 2016-11-22
9368320 Stage apparatus, and charged particle beam apparatus using same Akira Nishioka, Masaki Mizuochi, Hiroshi Tsuji 2016-06-14
8946652 Sample positioning apparatus, sample stage, and charged particle beam apparatus Motohiro TAKAHASHI, Hironori Ogawa, Nobuo Shibata, Masaki Mizuochi, Hiroshi Tsuji 2015-02-03
8822952 Charged particle beam apparatus having noise absorbing arrangements Daisuke Muto, Masanori Watanabe, Masaru Matsushima, Masahiro Akatsu, Yusuke Tanba +1 more 2014-09-02
8823309 Stage device Hironori Ogawa, Masahiro Koyama, Nobuo Shibata, Masaru Matsushima, Katsunori Onuki +1 more 2014-09-02
8653455 Charged particle beam device and evaluation method using the charged particle beam device Hiroyuki Kitsunai, Seiichiro Kanno, Masaru Matsushima, Go Miya 2014-02-18
8174229 Sample stage apparatus and method of controlling the same Masashi Fujita, Takashi Kobayashi 2012-05-08
8076651 Specimen stage apparatus and specimen stage positioning control method Masahiro Koyama, Hironori Ogawa, Nobuo Shibata, Masaru Matsushima, Toshinori Kobayashi 2011-12-13
8010023 Developing device, process cartridge and image forming apparatus Shin Murayama, Ryuji Inoue, Shintaro Yamada 2011-08-30
7795581 Pattern measuring method and electron microscope Sho Takami 2010-09-14
7541719 Stage and X-Y stage each on which to place sample, and charged-particle beam apparatus Masashi Fujita 2009-06-02
7498506 Foot volume pedal systems and methods 2009-03-03
6943945 Two axis state for microscope Eiichi Seya 2005-09-13
6782226 Developing device Junji Machida, Hidetoshi Miyamoto, Tetsumaru Fujita, Masahiko Matsuura, Yoshiko Yaoi +1 more 2004-08-24
6762998 Access network system Hiroyuki Asano 2004-07-13
6754309 Communication device and access network device Hiroyuki Asano 2004-06-22
6266508 Developing apparatus including an AC voltage applying device Hiroshi Goto, Tateki Oka 2001-07-24