Issued Patents All Time
Showing 26–50 of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8274048 | Scanning electron microscope having time constant measurement capability | Hideyuki Kazumi, Koichiro Takeuchi, Atsushi Kobaru, Seiko Oomori | 2012-09-25 |
| 8263934 | Method for detecting information of an electric potential on a sample and charged particle beam apparatus | Minoru Yamazaki, Hideyuki Kazumi, Osamu Nasu | 2012-09-11 |
| 8080790 | Scanning electron microscope | Minoru Yamazaki, Hideyuki Kazumi, Manabu Yano, Kazunari Asao, Takeshi Mizuno +1 more | 2011-12-20 |
| 7989768 | Scanning electron microscope | Minoru Yamazaki, Hideyuki Kazumi, Koichiro Takeuchi, Hisaya Murakoshi | 2011-08-02 |
| 7960696 | Method for inspecting and measuring sample and scanning electron microscope | Makoto Ezumi, Satoru Iwama, Junichi Kakuta, Takahiro Sato | 2011-06-14 |
| 7763852 | Scanning electron microscope having time constant measurement capability | Hideyuki Kazumi, Koichiro Takeuchi, Atsushi Kobaru, Seiko Oomori | 2010-07-27 |
| 7723681 | Observation method with electron beam | Yuki Ojima, Satoru Iwama | 2010-05-25 |
| 7700918 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2010-04-20 |
| 7566839 | Contact-breaker device, circuit and apparatus comprising the same, and method for assembling contact-breaker device | Kimihiro Saeki, Keisabro Tozawa, Yukito Kohno, Kiyoshi Kobayashi, Toshio Tobe +2 more | 2009-07-28 |
| 7372028 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2008-05-13 |
| 7087899 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2006-08-08 |
| 6946656 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2005-09-20 |
| 5196915 | Semiconductor device | Osamu Ito, Tadamichi Asai, Toshio Ogawa, Mitsuru Hasegawa, Yoshishige Endoh +2 more | 1993-03-23 |
| 5016089 | Substrate for hybrid IC, hybrid IC using the substrate and its applications | Mituru Fujii, Tadamichi Asai, Toshio Ogawa, Osamu Ito, Mitsuru Hasegawa +2 more | 1991-05-14 |
| 4873022 | Electrically conductive paste, electronic circuit component and method for producing same | Toshio Ogawa, Mituru Fujii, Tadamichi Asai, Hiroshi Ohtsu, Kazuhiko Ato | 1989-10-10 |
| 4816949 | Magnetic head containing amorphous alloy and crystallizable glass | Seiichi Yamada, Takashi Naitoh, Takashi Namekawa, Ryoo Gotoo, Toshikazu Nishiyama | 1989-03-28 |
| 4718999 | Air-fuel ratio detector | Seiko Suzuki, Masayuki Miki, Takao Sasayama, Toshitaka Suzuki, Nobuo Sato +1 more | 1988-01-12 |
| 4603008 | Critical temperature sensitive resistor material | Hiromi Tosaki, Hideo Arima, Yasuji Kamata | 1986-07-29 |
| 4587040 | Thick film thermistor composition | Hiromi Tosaki, Teruo Mozume, Hideo Arima | 1986-05-06 |
| 4586143 | Gas detecting apparatus | Masayoshi Kaneyasu, Takanobu Noro, Hideo Arima, Mitsuko Ito, Shoichi Iwanaga +2 more | 1986-04-29 |
| 4547625 | Glass multilayer wiring board and method for its manufacture | Hiromi Tosaki, Hirayoshi Tanei, Nobuyuki Sugishita | 1985-10-15 |
| 4490429 | Process for manufacturing a multilayer circuit board | Hiromi Tosaki, Nobuyuki Sugishita | 1984-12-25 |
| 4481813 | Dew sensor | Hirayoshi Tanei, Shoichi Iwanaga, Hiroshi Otsu, Hiromi Isonae | 1984-11-13 |
| 4457161 | Gas detection device and method for detecting gas | Shoichi Iwanaga, Nobuo Sato, Tokio Isogai, Takanobu Noro, Hideo Arima | 1984-07-03 |
| 4424251 | Thick-film multi-layer wiring board | Nobuyuki Sugishita | 1984-01-03 |