Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8481934 | Method for inspecting and measuring sample and scanning electron microscope | Makoto Ezumi, Junichi Kakuta, Takahiro Sato, Akira Ikegami | 2013-07-09 |
| 7960696 | Method for inspecting and measuring sample and scanning electron microscope | Makoto Ezumi, Junichi Kakuta, Takahiro Sato, Akira Ikegami | 2011-06-14 |
| 7723681 | Observation method with electron beam | Yuki Ojima, Akira Ikegami | 2010-05-25 |
| 7375329 | Scanning electron microscope | Masashi Fujita, Hiroki Kawada | 2008-05-20 |
| 6995370 | Scanning electron microscope | Masashi Fujita, Hiroki Kawada | 2006-02-07 |