Issued Patents All Time
Showing 76–84 of 84 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7187438 | Apparatus and method for inspecting defects | Minori Noguchi, Yoshimasa Ooshima, Hidetoshi Nishiyama, Tetsuya Watanabe | 2007-03-06 |
| 7115892 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Kenji Watanabe, Tetsuya Watanabe +1 more | 2006-10-03 |
| 7061602 | Method of inspecting a semiconductor device and an apparatus thereof | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya +4 more | 2006-06-13 |
| 6998630 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Kenji Watanabe, Tetsuya Watanabe +1 more | 2006-02-14 |
| 6936835 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ohshima, Kenji Watanabe, Tetsuya Watanabe +1 more | 2005-08-30 |
| 6888959 | Method of inspecting a semiconductor device and an apparatus thereof | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya +4 more | 2005-05-03 |
| 6797975 | Method and its apparatus for inspecting particles or defects of a semiconductor device | Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Kenji Watanabe, Tetsuya Watanabe +1 more | 2004-09-28 |
| 6731384 | Apparatus for detecting foreign particle and defect and the same method | Yoshimasa Ohshima, Minori Noguchi, Hidetoshi Nishiyama, Kenji Mitomo, Takashi Okawa +1 more | 2004-05-04 |
| 6218764 | Actuator using electromechanical transducer and drive pulse generator suitable thereof | Ryuichi Yoshida, Toshiro Higuchi | 2001-04-17 |