RK

Ryoung-Han Kim

Globalfoundries: 13 patents #279 of 4,424Top 7%
AM AMD: 5 patents #2,159 of 9,279Top 25%
TI Texas Instruments: 2 patents #5,248 of 12,488Top 45%
TT Tessera Advanced Technologies: 1 patents #19 of 31Top 65%
📍 Clifton Park, NY: #122 of 1,126 inventorsTop 15%
🗺 New York: #6,536 of 115,490 inventorsTop 6%
Overall (All Time): #201,426 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Showing 1–21 of 21 patents

Patent #TitleCo-InventorsDate
RE50384 Multilayer interconnect structure and method for integrated circuits 2025-04-15
10950488 Integration of finFET device Kwanyong LIM, Youn Sung Choi 2021-03-16
9029263 Method of printing multiple structure widths using spacer double patterning Youn Sung Choi 2015-05-12
8815748 Method of forming semiconductor device with multiple level patterning Thomas I. Wallow, Jongwook Kye, Harry J. Levinson 2014-08-26
8792161 Optical polarizer with nanotube array Bruno M. LaFontaine, Harry J. Levinson, Uzodinma Okoroanyanwu 2014-07-29
8664113 Multilayer interconnect structure and method for integrated circuits 2014-03-04
8642474 Spacer lithography Yunfei Deng, Thomas I. Wallow, Bruno La Fontaine 2014-02-04
8586269 Method for forming a high resolution resist pattern on a semiconductor wafer Uzodinma Okoroanyanwu, Harry J. Levinson, Thomas I. Wallow 2013-11-19
8450833 Spacer double patterning that prints multiple CD in front-end-of-line 2013-05-28
8445182 Double exposure technology using high etching selectivity Jong-wook Kye 2013-05-21
8435884 Method for forming an interconnect structure Matthew E. Colburn 2013-05-07
8303831 Methods for fabricating semiconductor devices 2012-11-06
8236592 Method of forming semiconductor device Thomas I. Wallow, Harry J. Levinson, Jongwook Kye, Alden Acheta 2012-08-07
8009274 In-die focus monitoring with binary mask 2011-08-30
7851136 Stabilization of deep ultraviolet photoresist Harry J. Levinson, Thomas I. Wallow 2010-12-14
7829266 Multiple exposure technique using OPC to correct distortion Yunfei Deng, Jongwook Kye 2010-11-09
7767985 EUV pellicle and method for fabricating semiconductor dies using same Uzodinma Okoroanyanwu 2010-08-03
7723704 EUV pellicle with increased EUV light transmittance Obert R. Wood, II, Thomas I. Wallow 2010-05-25
7718529 Inverse self-aligned spacer lithography Yunfei Deng, Thomas I. Wallow 2010-05-18
7704680 Double exposure technology using high etching selectivity Jong-wook Kye 2010-04-27
7663127 EUV debris mitigation filter and method for fabricating semiconductor dies using same Obert R. Wood, II, Thomas I. Wallow 2010-02-16