Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8269489 | System and method for eddy current inspection of parts with complex geometries | Changting Wang, Yury Alexeyevich Plotnikov, Ui Suh | 2012-09-18 |
| 8013599 | Methods and apparatus for testing a component | Ui Suh, Gigi Gambrell, John Ertel | 2011-09-06 |
| 7994780 | System and method for inspection of parts with an eddy current probe | Haiyan Sun, Changting Wang | 2011-08-09 |
| 7952348 | Flexible eddy current array probe and methods of assembling the same | Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, Ui Suh | 2011-05-31 |
| 7888932 | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same | Ui Suh, Yuri Alexeyevich Plotnikov, Changting Wang, Ralph Gerald Isaacs | 2011-02-15 |
| 7817845 | Multi-frequency image processing for inspecting parts having complex geometric shapes | Ui Suh, Gigi Gambrell, Preeti Pisupati, Peyush Kumar Mishra, Sandeep Kumar Dewangan +1 more | 2010-10-19 |
| 7689030 | Methods and apparatus for testing a component | Ui Suh, Gigi Gambrell, Preeti Pisupati | 2010-03-30 |
| 7436992 | Methods and apparatus for testing a component | Ui Suh, Gigi Gambrell, John Ertel | 2008-10-14 |
| 7337651 | Method for performing model based scanplan generation of a component under inspection | Suneel Tumkur Shankarappa, Vamshi Krishna Reddy Kommareddy, Ui Suh, Mandar Diwakar Godbole, Anjani Narendra Schrad +1 more | 2008-03-04 |
| 7206706 | Inspection method and system using multifrequency phase analysis | Changting Wang, Ui Suh, Serkan Ertekin | 2007-04-17 |
| 7154265 | Eddy current probe and inspection method | Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, Walter J. Bantz +1 more | 2006-12-26 |
| 7015690 | Omnidirectional eddy current probe and inspection system | Changting Wang, Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, Gigi Gambrell | 2006-03-21 |
| 6812697 | Molded eddy current array probe | Shridhar Champaknath Nath, Sandie Elizabeth Gresham, Richard L. Trantow, Douglas Ingram, John Ertel +3 more | 2004-11-02 |
| 6696830 | Method and inspection standard for eddy current inspection | Dominick A. Casarcia, Douglas Ingram | 2004-02-24 |
| 4562392 | Stylus type touch probe system | Richard K. Davis | 1985-12-31 |