Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6906808 | Methods and apparatus for measuring a surface contour of an object | Joseph Benjamin Ross | 2005-06-14 |
| 6812697 | Molded eddy current array probe | William Stewart McKnight, Shridhar Champaknath Nath, Sandie Elizabeth Gresham, Douglas Ingram, John Ertel +3 more | 2004-11-02 |
| 6563307 | Eddy current inspection probe | Francis Howard Little | 2003-05-13 |
| 6552536 | Reference standard for inspection of dual-layered coatings | — | 2003-04-22 |
| 6540231 | Surface following brush seal | Jimmy A. Murphy, Ronald R. Eskridge | 2003-04-01 |
| 6469503 | Eddy current inspection probe and method of use | Sandie Elizabeth Gresham, Douglas Ingram | 2002-10-22 |
| 6356069 | Eddy current calibration standard | Francis Howard Little, Gigi Gambrell, John Ertel | 2002-03-12 |
| 6339326 | Eddy current inspection probe | — | 2002-01-15 |
| 6075593 | Method for monitoring and controlling laser shock peening using temporal light spectrum analysis | Ui Suh | 2000-06-13 |
| 5987991 | Determination of Rayleigh wave critical angle | Manohar Bashyam | 1999-11-23 |
| 5974889 | Ultrasonic multi-transducer rotatable scanning apparatus and method of use thereof | — | 1999-11-02 |