| 8269489 |
System and method for eddy current inspection of parts with complex geometries |
Changting Wang, Yury Alexeyevich Plotnikov, William Stewart McKnight |
2012-09-18 |
$20,205,000 |
| 8013599 |
Methods and apparatus for testing a component |
Gigi Gambrell, John Ertel, William Stewart McKnight |
2011-09-06 |
$22,170,000 |
| 7952348 |
Flexible eddy current array probe and methods of assembling the same |
Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, William Stewart McKnight |
2011-05-31 |
$32,135,000 |
| 7948233 |
Omnidirectional eddy current array probes and methods of use |
Aparna Chakrapani Sheila-Vadde, Changting Wang |
2011-05-24 |
$28,053,000 |
| 7888932 |
Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same |
William Stewart McKnight, Yuri Alexeyevich Plotnikov, Changting Wang, Ralph Gerald Isaacs |
2011-02-15 |
$37,156,000 |
| 7817845 |
Multi-frequency image processing for inspecting parts having complex geometric shapes |
Gigi Gambrell, William Stewart McKnight, Preeti Pisupati, Peyush Kumar Mishra, Sandeep Kumar Dewangan +1 more |
2010-10-19 |
$43,038,000 |
| 7689030 |
Methods and apparatus for testing a component |
Gigi Gambrell, William Stewart McKnight, Preeti Pisupati |
2010-03-30 |
$33,416,000 |
| 7657389 |
Method of aligning probe for eddy current inspection |
Richard C. Knepfle |
2010-02-02 |
$58,056,000 |
| 7518359 |
Inspection of non-planar parts using multifrequency eddy current with phase analysis |
Changting Wang |
2009-04-14 |
$44,802,000 |
| 7436992 |
Methods and apparatus for testing a component |
Gigi Gambrell, John Ertel, William Stewart McKnight |
2008-10-14 |
$63,845,000 |
| 7337651 |
Method for performing model based scanplan generation of a component under inspection |
Suneel Tumkur Shankarappa, William Stewart McKnight, Vamshi Krishna Reddy Kommareddy, Mandar Diwakar Godbole, Anjani Narendra Schrad +1 more |
2008-03-04 |
$37,760,000 |
| 7206706 |
Inspection method and system using multifrequency phase analysis |
Changting Wang, William Stewart McKnight, Serkan Ertekin |
2007-04-17 |
$48,238,000 |
| 7154265 |
Eddy current probe and inspection method |
Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight +1 more |
2006-12-26 |
$23,903,000 |
| 6914215 |
Real time laser shock peening quality assurance by natural frequency analysis |
Brian Michael Davis, Robert D. McClain, Seetha Ramaiah Mannava |
2005-07-05 |
$35,039,000 |
| 6907358 |
Eddy current inspection method |
Clifford Sneed, Jr. |
2005-06-14 |
$33,388,000 |
| 6629464 |
Laser shock peening quality assurance by acoustic analysis |
James D. Risbeck |
2003-10-07 |
|
| 6570126 |
Simultaneous offset dual sided laser shock peening using low energy laser beams |
Seetharamaiah Mannava, Todd Jay Rockstroh |
2003-05-27 |
$63,628,000 |
| 6570125 |
Simultaneous offset dual sided laser shock peening with oblique angle laser beams |
Seetharamaiah Mannava, Todd Jay Rockstroh |
2003-05-27 |
$63,628,000 |
| 6422082 |
Laser shock peening quality assurance by ultrasonic analysis |
— |
2002-07-23 |
$57,337,000 |
| 6296448 |
Simultaneous offset dual sided laser shock peening |
James D. Risbeck |
2001-10-02 |
$123,449,000 |
| 6237419 |
Aspherical curved element transducer to inspect a part with curved entry surface |
Douglas Ingram, Richard Eugene Klaassen, Walter J. Bantz |
2001-05-29 |
$129,610,000 |
| 6075593 |
Method for monitoring and controlling laser shock peening using temporal light spectrum analysis |
Richard L. Trantow |
2000-06-13 |
$212,644,000 |
