Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8269489 | System and method for eddy current inspection of parts with complex geometries | Changting Wang, Yury Alexeyevich Plotnikov, William Stewart McKnight | 2012-09-18 |
| 8013599 | Methods and apparatus for testing a component | Gigi Gambrell, John Ertel, William Stewart McKnight | 2011-09-06 |
| 7952348 | Flexible eddy current array probe and methods of assembling the same | Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, William Stewart McKnight | 2011-05-31 |
| 7948233 | Omnidirectional eddy current array probes and methods of use | Aparna Chakrapani Sheila-Vadde, Changting Wang | 2011-05-24 |
| 7888932 | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same | William Stewart McKnight, Yuri Alexeyevich Plotnikov, Changting Wang, Ralph Gerald Isaacs | 2011-02-15 |
| 7817845 | Multi-frequency image processing for inspecting parts having complex geometric shapes | Gigi Gambrell, William Stewart McKnight, Preeti Pisupati, Peyush Kumar Mishra, Sandeep Kumar Dewangan +1 more | 2010-10-19 |
| 7689030 | Methods and apparatus for testing a component | Gigi Gambrell, William Stewart McKnight, Preeti Pisupati | 2010-03-30 |
| 7657389 | Method of aligning probe for eddy current inspection | Richard C. Knepfle | 2010-02-02 |
| 7518359 | Inspection of non-planar parts using multifrequency eddy current with phase analysis | Changting Wang | 2009-04-14 |
| 7436992 | Methods and apparatus for testing a component | Gigi Gambrell, John Ertel, William Stewart McKnight | 2008-10-14 |
| 7337651 | Method for performing model based scanplan generation of a component under inspection | Suneel Tumkur Shankarappa, William Stewart McKnight, Vamshi Krishna Reddy Kommareddy, Mandar Diwakar Godbole, Anjani Narendra Schrad +1 more | 2008-03-04 |
| 7206706 | Inspection method and system using multifrequency phase analysis | Changting Wang, William Stewart McKnight, Serkan Ertekin | 2007-04-17 |
| 7154265 | Eddy current probe and inspection method | Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight +1 more | 2006-12-26 |
| 6914215 | Real time laser shock peening quality assurance by natural frequency analysis | Brian Michael Davis, Robert D. McClain, Seetha Ramaiah Mannava | 2005-07-05 |
| 6907358 | Eddy current inspection method | Clifford Sneed, Jr. | 2005-06-14 |
| 6629464 | Laser shock peening quality assurance by acoustic analysis | James D. Risbeck | 2003-10-07 |
| 6570126 | Simultaneous offset dual sided laser shock peening using low energy laser beams | Seetharamaiah Mannava, Todd Jay Rockstroh | 2003-05-27 |
| 6570125 | Simultaneous offset dual sided laser shock peening with oblique angle laser beams | Seetharamaiah Mannava, Todd Jay Rockstroh | 2003-05-27 |
| 6422082 | Laser shock peening quality assurance by ultrasonic analysis | — | 2002-07-23 |
| 6296448 | Simultaneous offset dual sided laser shock peening | James D. Risbeck | 2001-10-02 |
| 6237419 | Aspherical curved element transducer to inspect a part with curved entry surface | Douglas Ingram, Richard Eugene Klaassen, Walter J. Bantz | 2001-05-29 |
| 6075593 | Method for monitoring and controlling laser shock peening using temporal light spectrum analysis | Richard L. Trantow | 2000-06-13 |