Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7154265 | Eddy current probe and inspection method | Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight, Walter J. Bantz +1 more | 2006-12-26 |
MT
Mottito Togo
Overall (All Time): #3,437,411 of 4,157,543Top 85%
1
Patents All Time