Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324896 | Method and apparatus for acquiring resource | Jin Zhang | 2019-06-18 |
| 9759686 | Magnetic inspection systems for inspection of target objects | Mandar Diwakar Godbole, Andrzej Michal May, Nilesh Tralshawala, Waseem Ibrahim Faidi | 2017-09-12 |
| 8884614 | Eddy current array probe | Yuri Alexeyevich Plotnikov, Mandar Diwakar Godbole, Aparna Chakrapani Sheila-Vadde | 2014-11-11 |
| 8710834 | Drive coil, measurement probe comprising the drive coil and methods utilizing the measurement probe | Andrzej Michal May, Waseem Ibrahim Faidi, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde, Mandar Diwakar Godbole +3 more | 2014-04-29 |
| 8436608 | Eddy current inspection system and method | Haiyan Sun, Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, Aparna Chakrapani Sheila-Vadde | 2013-05-07 |
| 8378668 | Method for non-destructive testing of composite systems | Waseem Ibrahim Faidi, Stephane Renou, Shu Ching Quek, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde +1 more | 2013-02-19 |
| 8269489 | System and method for eddy current inspection of parts with complex geometries | Yury Alexeyevich Plotnikov, Ui Suh, William Stewart McKnight | 2012-09-18 |
| 8179132 | Method and system for integrating eddy current inspection with a coordinate measuring device | Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Haiyan Sun, Francis Howard Little +2 more | 2012-05-15 |
| 7994780 | System and method for inspection of parts with an eddy current probe | Haiyan Sun, William Stewart McKnight | 2011-08-09 |
| 7952348 | Flexible eddy current array probe and methods of assembling the same | Haiyan Sun, Yuri Alexeyevich Plotnikov, William Stewart McKnight, Ui Suh | 2011-05-31 |
| 7948233 | Omnidirectional eddy current array probes and methods of use | Aparna Chakrapani Sheila-Vadde, Ui Suh | 2011-05-24 |
| 7888932 | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same | William Stewart McKnight, Ui Suh, Yuri Alexeyevich Plotnikov, Ralph Gerald Isaacs | 2011-02-15 |
| 7817845 | Multi-frequency image processing for inspecting parts having complex geometric shapes | Ui Suh, Gigi Gambrell, William Stewart McKnight, Preeti Pisupati, Peyush Kumar Mishra +1 more | 2010-10-19 |
| 7518359 | Inspection of non-planar parts using multifrequency eddy current with phase analysis | Ui Suh | 2009-04-14 |
| 7402999 | Pulsed eddy current pipeline inspection system and method | Yuri Alexeyevich Plotnikov, Andrew May, Shridhar Champaknath Nath | 2008-07-22 |
| 7206706 | Inspection method and system using multifrequency phase analysis | William Stewart McKnight, Ui Suh, Serkan Ertekin | 2007-04-17 |
| 7154265 | Eddy current probe and inspection method | Mottito Togo, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight, Walter J. Bantz +1 more | 2006-12-26 |
| 7015690 | Omnidirectional eddy current probe and inspection system | Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, William Stewart McKnight, Gigi Gambrell | 2006-03-21 |
| 7005851 | Methods and apparatus for inspection utilizing pulsed eddy current | Andrew May, Yuri Alexeyevich Plotnikov | 2006-02-28 |
| 6999291 | Method and apparatus for node electronics unit architecture | Emad Andarawis Andarawis, Daniel White Sexton, Austars Raymond Schnore, Jr., Ertugrul Berkcan, Samantha Rao +5 more | 2006-02-14 |
| 6892115 | Method and apparatus for optimized centralized critical control architecture for switchgear and power equipment | Ertugrul Berkcan, Daniel White Sexton, Scott Charles Evans, Marc Robert Pearlman, Emad Andarawis Andarawis +4 more | 2005-05-10 |