Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7154265 | Eddy current probe and inspection method | Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight +1 more | 2006-12-26 |
| 6237419 | Aspherical curved element transducer to inspect a part with curved entry surface | Ui Suh, Douglas Ingram, Richard Eugene Klaassen | 2001-05-29 |
| 4594897 | Inspection of the internal portion of objects using ultrasonics | — | 1986-06-17 |