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Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
YP

Yuri Alexeyevich Plotnikov — 33 Patents

GE: 28 patents #800 of 36,430Top 3%
THTransportation Ip Holdings: 2 patents #224 of 657Top 35%
MDMorpho Detection: 1 patents #53 of 132Top 45%
VGVetco Gray: 1 patents #168 of 364Top 50%
Niskayuna, NY: #118 of 949 inventorsTop 15%
New York: #3,562 of 115,490 inventorsTop 4%
Overall (All Time): #105,480 of 4,157,543Top 3%
33 Patents All Time
Yuri Alexeyevich Plotnikov has been granted 33 US patents while listed as an inventor at GE. The first was granted in 2004 and the most recent in October 2023. Yuri Alexeyevich Plotnikov ranks #105,480 of 4,157,543 US inventors in our database (top 2.5%). Patent records list Yuri Alexeyevich Plotnikov in Niskayuna, NY, US.

Patents per Year

Patents granted per year, 2004 to 2023Bar chart with a peak of 5 patents in 2016.peak 52004: 2 patents20042005: 1 patents2006: 3 patents20062008: 2 patents2010: 1 patents20102011: 3 patents2013: 1 patents20132014: 3 patents2016: 5 patents20162017: 5 patents2018: 1 patents20182019: 2 patents2021: 2 patents20212022: 1 patents2023: 1 patents2023

Issued Patents All Time

Showing 1–25 of 33 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11782181 Data fusion enhanced multi-modality wellbore integrity inspection system Ansas Matthias Kasten, Sudeep Mandal, Sarah Lillian Katz, Frederick Wilson Wheeler, William Robert Ross +1 more 2023-10-10
11400964 Route examining system and method Joseph Forrest Noffsinger, Ajith Kuttannair Kumar, Jeffrey Michael Fries, Steven Joseph Ehret 2022-08-02
11136053 Route examining system Brett Alexander Matthews, Ajith Kuttannair Kumar, Jeffrey Michael Fries, Joseph Forrest Noffsinger, Samhitha Palanganda Poonacha +6 more 2021-10-05
10884158 Multi-barrier wellbore integrity inspection system with eccentricity correction Ansas Matthias Kasten, Adrian Ivan, William Robert Ross 2021-01-05
10501100 Route examining system Brett Alexander Matthews, Ajith Kuttannair Kumar, Jeffrey Michael Fries, Joseph Forrest Noffsinger, Samhitha Palanganda Poonacha +6 more 2019-12-10
10167005 Route examining system and method Joseph Forrest Noffsinger, Ajith Kuttannair Kumar, Jeffrey Michael Fries, Steven Joseph Ehret 2019-01-01
10152784 System and method for detecting defects in a component Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Shyamsunder Tondanur Mandayam, Bryon Edward Knight, Satheesh Jeyaraman +1 more 2018-12-11 $25,825,000
9834237 Route examining system and method Brett Alexander Matthews, Ajith Kuttannair Kumar, Jeffrey Michael Fries, Joseph Forrest Noffsinger, Samhitha Palanganda Poonacha +6 more 2017-12-05 $22,698,000
9802631 Route examining system Brett Alexander Matthews, Gregory Boverman, Frederick Wilson Wheeler, Majid Nayeri, Jeffrey Michael Fries 2017-10-31 $13,610,000
9746583 Gas well integrity inspection system Ertugrul Berkcan, John Scott Price, Edward James Nieters, William Robert Ross, Clifford Bueno +1 more 2017-08-29
9669851 Route examination system and method Jared Klineman Cooper, Samuel William Golden, Joseph Forrest Noffsinger, Ajith Kuttannair Kumar, Jeffrey Michael Fries +2 more 2017-06-06 $19,371,000
9638648 Flaw detection using transient thermography Harry Israel Ringermacher 2017-05-02 $15,007,000
9481384 Route examining system and method Joseph Forrest Noffsinger, Ajith Kuttannair Kumar, Jeffrey Michael Fries, Steven Joseph Ehret 2016-11-01 $20,807,000
9435766 System and method for inspection of components Daniel John Noonan, John McLeod, Alessio Andolfi, Riccardo Catastini 2016-09-06 $17,133,000
9416649 Method and system for determination of pipe location in blowout preventers Emad Andarawis Andarawis, Daniel White Sexton, Christopher Edward Wolfe, Edward James Nieters, Michael Joseph Dell'Anno 2016-08-16 $26,436,000
9416652 Sensing magnetized portions of a wellhead system to monitor fatigue loading Teresa Tianshu Chen-Keat, Yanyan Wu, Chad Eric Yates, Xichang Zhang, Li Zheng +1 more 2016-08-16
9244049 System and method for detection of nutritional parameters in food items Yongjae Lee, Aghogho Obi, Seog Tae Kim, William Chester Platt, James William Bray +2 more 2016-01-26 $29,329,000
8914171 Route examining system and method Joseph Forrest Noffsinger, Ajith Kuttannair Kumar, Jeffrey Michael Fries, Srilatha Boyanapally, Steven Joseph Ehret 2014-12-16 $17,704,000
8884614 Eddy current array probe Changting Wang, Mandar Diwakar Godbole, Aparna Chakrapani Sheila-Vadde 2014-11-11 $19,590,000
8761438 Systems and methods for object imaging Young Kyo Lee, Erik Edmund Magnuson 2014-06-24
8436608 Eddy current inspection system and method Haiyan Sun, Changting Wang, Shridhar Champaknath Nath, Aparna Chakrapani Sheila-Vadde 2013-05-07 $30,576,000
7952348 Flexible eddy current array probe and methods of assembling the same Haiyan Sun, Changting Wang, William Stewart McKnight, Ui Suh 2011-05-31 $32,135,000
7911205 Electromagnetic resonance frequency inspection systems and methods Nilesh Tralshawala 2011-03-22 $23,935,000
7888932 Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same William Stewart McKnight, Ui Suh, Changting Wang, Ralph Gerald Isaacs 2011-02-15 $37,156,000
7830140 Eddy current system and method for estimating material properties of parts Nilesh Tralshawala 2010-11-09 $22,882,000