Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11099002 | Systems and methods of assessing a coating microstructure | Esha Sen Gupta | 2021-08-24 |
| 10152784 | System and method for detecting defects in a component | Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Bryon Edward Knight, Satheesh Jeyaraman +1 more | 2018-12-11 |
| 7233867 | Eddy current inspection method and system | Preeti Pisupati, Gigi Gambrell, Amitabha Dutta | 2007-06-19 |
| 7154265 | Eddy current probe and inspection method | Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, William Stewart McKnight, Walter J. Bantz +1 more | 2006-12-26 |