Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7521917 | Method and apparatus for testing material integrity | Gopichand Katragadda, Manoj Kumar Koyithitta Meethal, Slvaramanivas Ramaswamy | 2009-04-21 |
| 7234355 | Method and system for inspecting flaws using ultrasound scan data | Sandeep Kumar Dewangan, Anandraj Sengupta | 2007-06-26 |
| 7233867 | Eddy current inspection method and system | Preeti Pisupati, Gigi Gambrell, Shyamsunder Tondanur Mandayam | 2007-06-19 |