YP

Yury Alexeyevich Plotnikov

GE: 2 patents #13,562 of 36,430Top 40%
📍 Niskayuna, NY: #623 of 949 inventorsTop 70%
🗺 New York: #48,759 of 115,490 inventorsTop 45%
Overall (All Time): #2,096,457 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
8269489 System and method for eddy current inspection of parts with complex geometries Changting Wang, Ui Suh, William Stewart McKnight 2012-09-18
7516663 Systems and method for locating failure events in samples under load Harry Israel Ringermacher, Donald Robert Howard, Bryon Edward Knight, Mark John Osterlitz, Jian Li +2 more 2009-04-14