MT

Masami Takigawa

Fujitsu Limited: 7 patents #4,529 of 24,456Top 20%
Sumitomo Electric Industries: 4 patents #6,367 of 21,551Top 30%
PA Panasonic: 4 patents #6,180 of 21,108Top 30%
AD Advantest: 2 patents #465 of 1,193Top 40%
Overall (All Time): #267,882 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
11961345 Wireless communication system Michihiko Fukuda, Hitoshi Namba 2024-04-16
10636235 Vehicle wireless communication for performing communication between vehicle-mounted device and mobile device, identification information registration method Genki SAITO 2020-04-28
9811961 Vehicular near field communication system, portable device, and on-board instrument Jun FUJIYAMA, Naoki Hayashi 2017-11-07
9813846 Short-distance radio communication system for vehicle Naoki Hayashi, Jun FUJIYAMA, Toru Nishimura 2017-11-07
7041512 Electron beam exposure apparatus, electron beam exposing method, semiconductor element manufacturing method, and pattern error detection method Kouji Fujiyoshi 2006-05-09
6882693 Digital signal receiver Hiroaki Ozeki, Hitonobu Furukawa, Junichi Fukutani, Kazuyori Domoto 2005-04-19
6744830 Digital broadcasting signal receiver Hitonobu Furukawa, Hiroaki Ozeki, Junichi Fukutani, Yuichi Watanabe, Kazuyori Domoto 2004-06-01
6389082 Receiver Hitonobu Furukawa, Akira Mishima, Hiroaki Ozeki 2002-05-14
6363126 Demodulator Hitonobu Furukawa, Akira Mishima, Hiroaki Ozeki, Sachiko Hayashi 2002-03-26
6344655 Multicolumn charged-particle beam lithography system Tomohiro Sakazaki 2002-02-05
6242751 Charged-particle-beam exposure device and charged-particle-beam exposure method Akio Takemoto, Yoshihisa Ooaeh, Tomohiko Abe, Hiroshi Yasuda, Takamasa Satoh +7 more 2001-06-05
5969365 Charged-particle-beam exposure device and charged-particle-beam exposure method Akio Takemoto, Yoshihisa Ooaeh, Tomohiko Abe, Hiroshi Yasuda, Takamasa Satoh +7 more 1999-10-19
5965895 Method of providing changed particle beam exposure in which representative aligning marks on an object are detected to calculate an actual position to perform exposure Takamasa Satoh, Hiroshi Yasuda, Junichi Kai, Yoshihisa Oae, Hisayasu Nishino +8 more 1999-10-12
5757015 Charged-particle-beam exposure device and charged-particle-beam exposure method Akio Takemoto, Yoshihisa Ooaeh, Tomohiko Abe, Hiroshi Yasuda, Takamasa Satoh +7 more 1998-05-26
5721432 Method of and system for charged particle beam exposure Takamasa Satoh, Hiroshi Yasuda, Junichi Kai, Yoshihisa Oae, Hisayasu Nishino +8 more 1998-02-24
5719402 Method of and system for charged particle beam exposure Takamasa Satoh, Hiroshi Yasuda, Junichi Kai, Yoshihisa Oae, Hisayasu Nishino +8 more 1998-02-17
5546319 Method of and system for charged particle beam exposure Takamasa Satoh, Hiroshi Yasuda, Junichi Kai, Yoshihisa Oae, Hisayasu Nishino +8 more 1996-08-13