Issued Patents All Time
Showing 51–75 of 175 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7463043 | Methods of probing an electronic device | Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens | 2008-12-09 |
| 7458816 | Shaped spring | Benjamin N. Eldridge, Stuart Wenzel | 2008-12-02 |
| 7444253 | Air bridge structures and methods of making and using air bridge structures | — | 2008-10-28 |
| 7435108 | Variable width resilient conductive contact structures | Benjamin N. Eldridge | 2008-10-14 |
| 7400157 | Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes | Gary W. Grube, Igor Y. Khandros, Benjamin N. Eldridge, Poya Lotfizadeh, Chih-Chiang Tseng | 2008-07-15 |
| 7371072 | Spring interconnect structures | Benjamin N. Eldridge, Gary W. Grube, Richard A. Larder | 2008-05-13 |
| 7347702 | Contact carriers (tiles) for populating larger substrates with spring contacts | Benjamin N. Eldridge, Thomas H. Dozier, II, Igor Y. Khandros, William D. Smith | 2008-03-25 |
| 7330039 | Method for making a socket to perform testing on integrated circuits | Igor Y. Khandros, Carl V. Reynolds | 2008-02-12 |
| 7325302 | Method of forming an interconnection element | Benjamin N. Eldridge | 2008-02-05 |
| 7312618 | Method and system for compensating thermally induced motion of probe cards | Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde | 2007-12-25 |
| 7287322 | Lithographic contact elements | Benjamin N. Eldridge, Gary W. Grube | 2007-10-30 |
| 7285968 | Apparatus and method for managing thermally induced motion of a probe card assembly | Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Makarand Shinde, Alexander H. Slocum +2 more | 2007-10-23 |
| 7262611 | Apparatuses and methods for planarizing a semiconductor contactor | Benjamin N. Eldridge, Gary W. Grube | 2007-08-28 |
| 7251884 | Method to build robust mechanical structures on substrate surfaces | Gary W. Grube, Benjamin N. Eldridge, Chadwick D. Sofield | 2007-08-07 |
| 7230437 | Mechanically reconfigurable vertical tester interface for IC probing | Benjamin N. Eldridge, Barbara Vasquez, Makarand Shinde, A. Nicholas Sporck | 2007-06-12 |
| 7225538 | Resilient contact structures formed and then attached to a substrate | Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros | 2007-06-05 |
| 7218127 | Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component | Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens | 2007-05-15 |
| 7202682 | Composite motion probing | Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens | 2007-04-10 |
| 7200930 | Probe for semiconductor devices | Igor Y. Khandros | 2007-04-10 |
| 7196531 | Method of manufacturing a probe card | Gary W. Grube, Igor Y. Khandros, Benjamin N. Eldridge, Poya Lotfizadeh, Jim Chih-Chiang Tseng | 2007-03-27 |
| 7168162 | Method of manufacturing a probe card | Gary W. Grube, Igor Y. Khandros, Benjamin N. Eldridge | 2007-01-30 |
| 7140883 | Contact carriers (tiles) for populating larger substrates with spring contacts | Igor Y. Khandros, Benjamin N. Eldridge, Thomas H. Dozier, II, William D. Smith | 2006-11-28 |
| 7142000 | Mounting spring elements on semiconductor devices, and wafer-level testing methodology | Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros | 2006-11-28 |
| 7127811 | Methods of fabricating and using shaped springs | Benjamin N. Eldridge, Stuart Wenzel | 2006-10-31 |
| 7122760 | Using electric discharge machining to manufacture probes | Benjamin N. Eldridge, Gary W. Grube | 2006-10-17 |