GM

Gaetan L. Mathieu

FO Formfactor: 153 patents #2 of 177Top 2%
TE Tessera: 8 patents #54 of 271Top 20%
BL Berkeley Lights: 7 patents #15 of 97Top 20%
FS Fairchild Semiconductor: 2 patents #274 of 715Top 40%
University of California: 2 patents #4,561 of 18,278Top 25%
📍 Varennes, CA: #1 of 84 inventorsTop 2%
Overall (All Time): #4,518 of 4,157,543Top 1%
175
Patents All Time

Issued Patents All Time

Showing 76–100 of 175 patents

Patent #TitleCo-InventorsDate
7119564 Method and system for compensating thermally induced motion of probe cards Rod Martens, Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder +1 more 2006-10-10
7086149 Method of making a contact structure with a distinctly formed tip structure Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros 2006-08-08
7084656 Probe for semiconductor devices Igor Y. Khandros 2006-08-01
7073254 Method for mounting a plurality of spring contact elements Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros 2006-07-11
7071714 Method and system for compensating for thermally induced motion of probe cards Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde 2006-07-04
7063541 Composite microelectronic spring structure and method for making same Gary W. Grube, Igor Y. Khandros 2006-06-20
7059047 Sockets for “springed” semiconductor devices Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros, David V. Pedersen +1 more 2006-06-13
7048548 Interconnect for microelectronic structures with enhanced spring characteristics Benjamin N. Eldridge 2006-05-23
7047638 Method of making microelectronic spring contact array Benjamin N. Eldridge, Carl V. Reynolds 2006-05-23
7024763 Methods for making plated through holes usable as interconnection wire or probe attachments Igor Y. Khandros, Carl V. Reynolds 2006-04-11
7010854 Re-assembly process for MEMS structures Benjamin N. Eldridge 2006-03-14
7002363 Method and system for compensating thermally induced motion of probe cards 2006-02-21
6972578 Method and system for compensating thermally induced motion of probe cards Rod Martens, Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder +1 more 2005-12-06
6956174 Tip structures Igor Y. Khandros 2005-10-18
6945827 Microelectronic contact structure Gary W. Grube, Alec Madsen 2005-09-20
6937037 Probe card assembly for contacting a device with raised contact elements Benjamin N. Eldridge, Gary W. Grube 2005-08-30
6920689 Method for making a socket to perform testing on integrated circuits Igor Y. Khandros, Carl V. Reynolds 2005-07-26
6913468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros 2005-07-05
6888229 Connection components with frangible leads and bus Thomas H. DiStefano, Gary W. Grube, Igor Y. Khandros, Jason Sweis, Laurie Union +1 more 2005-05-03
6864105 Method of manufacturing a probe card Gary W. Grube, Igor Y. Khandros, Benjamin N. Eldridge, Poya Lotfizadeh, Chih-Chiang Tseng 2005-03-08
6840374 Apparatus and method for cleaning test probes Igor Y. Khandros, Benjamin N. Eldridge, Treliant Fang, Gary W. Grube, Michael A. Drush +1 more 2005-01-11
6836962 Method and apparatus for shaping spring elements Igor Y. Khandros, Thomas H. Dozier, II, Gary W. Grube 2005-01-04
6835898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros 2004-12-28
6827584 Interconnect for microelectronic structures with enhanced spring characteristics Benjamin N. Eldridge 2004-12-07
6825422 Interconnection element with contact blade Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros, Alec Madsen 2004-11-30