Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11401137 | Overhead storage device | — | 2022-08-02 |
| 11242100 | Overhead storage devices, systems, and methods | Marc R. Ozarski | 2022-02-08 |
| 6396062 | Portable laser beam monitor | Jesse Buck | 2002-05-28 |
| 6229639 | Multiplexer for laser lithography | Alexander I. Ershov | 2001-05-08 |
| 6128323 | Reliable modular production quality narrow-band high REP rate excimer laser | David W. Myers, Herve A. Besaucele, Palash P. Das, Thomas Patrick Duffey, Alexander I. Ershov +14 more | 2000-10-03 |
| 6111907 | Laser chamber installation in and removal from a laser system housing | — | 2000-08-29 |
| 6067306 | Laser-illuminated stepper or scanner with energy sensor feedback | Richard L. Sandstrom, Palash P. Das, Igor V. Fomenkov, Herve A. Besaucele | 2000-05-23 |
| 5991324 | Reliable. modular, production quality narrow-band KRF excimer laser | David S. Knowles, James H. Azzola, Herve A. Besaucele, Palash P. Das, Alexander I. Ershov +8 more | 1999-11-23 |
| 5978405 | Laser chamber with minimized acoustic and shock wave disturbances | Tibor Juhasz, Richard C. Ujazdowski, Herve A. Besaucele, James H. Azzola | 1999-11-02 |
| 5336325 | Enhanced vertical thermal reactor system | John J. Devilbiss, Steve Lugosi | 1994-08-09 |
| 5044752 | Apparatus and process for positioning wafers in receiving devices | Henrik Thurfjell | 1991-09-03 |
| 4909631 | Method for film thickness and refractive index determination | Raul Y. Tan, David W. Myers, John F. Schipper, Michael Watts | 1990-03-20 |
| 4874240 | Characterization of semiconductor resist material during processing | Michael Watts, Thiloma I. Perera, David W. Myers, John F. Schipper, Raul V. Tan | 1989-10-17 |
| 4857738 | Absorption measurements of materials | David W. Myers, Thiloma I. Perera, John F. Schipper, Raul V. Tan, Michael Watts | 1989-08-15 |
| 4368169 | Pyrochemical processes for the decomposition of water | Ralph H. Kummler, Charles B. Leffert, Robert A. Piccirelli, Theodor Teichmann | 1983-01-11 |